Li Chen

45 papers C 3Journal 28Unranked 14
YearRankTypeTitle / Venue / Authors
2026 J jnl
Deep3BPP: Identification of Blood-Brain Barrier Penetrating Peptides Using Word Embedding Feature Extraction Method and CNN-LSTM.
IEEE Trans. Artif. Intell.
Md. Ashikur Rahman, Md Mamun Ali, Kawsar Ahmed, Imran Mahmud, Francis M. Bui, Li Chen, Mohammad Ali Moni
2025 J jnl
A 10-bit 50-MS/s Radiation Tolerant Split Coarse/Fine SAR ADC in 65-nm CMOS.
IEEE Trans. Very Large Scale Integr. Syst.
Ming Yan, Jaime Cardenas Chavez, Kamal El-Sankary, Li Chen, Xiaotong Lu
2025 J jnl
Study on Single Event Transients in Amplifier for Switched-Capacitor Circuits in CMOS Technology.
IEEE Access
Ming Yan, Jaime Cardenas Chavez, Adriana Noguera Cundar, Kamal El-Sankary, Li Chen
2024 J jnl
An Intelligent Thyroid Diagnosis System Utilizing Multiple Ensemble and Explainable Algorithms With Medical Supported Attributes.
IEEE Trans. Artif. Intell.
Ananda Sutradhar, Mustahsin Al Rafi, Pronab Ghosh, F. M. Javed Mehedi Shamrat, Md. Moniruzzaman, Kawsar Ahmed, A. K. M. Azad, Francis M. Bui, Li Chen, Mohammad Ali Moni
2024 J jnl
StackAMP: Stacking-Based Ensemble Classifier for Antimicrobial Peptide Identification.
IEEE Trans. Artif. Intell.
Tasmin Karim, Md. Shazzad Hossain Shaon, Md Mamun Ali, Kawsar Ahmed, Francis M. Bui, Li Chen
2023 — conf
FedRSMax: An Effective Aggregation Technique for Federated Learning with Medical Images.
CCECE
Md. Nazmul Hossen, Kawsar Ahmed, Francis M. Bui, Li Chen
2023 — conf
STACKION: Ion Channel-Modulating Peptides Identification Using Stacking-Based Ensemble Machine Learning.
CCECE
Md Mamun Ali, Kawsar Ahmed, Francis M. Bui, Li Chen
2021 J jnl
Radiation Tolerant SRAM Cell Design in 65nm Technology.
J. Electron. Test.
Jianan Wang, Xue Wu, Haonan Tian, Lixiang Li, Shuting Shi, Li Chen
2021 J jnl
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.
J. Electron. Test.
Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen
2019 J jnl
A Layout-Based Rad-Hard DICE Flip-Flop Design.
J. Electron. Test.
Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen
2019 — conf
A Low Power and Low Noise Voltage-Controlled Oscillator in 28-nm FDSOI Technology for Wireless Communication Applications.
CCECE
Abdul Baseer Khan, Jaime Cardenas, Li Chen, Muhammad Raashid Khan, Aqeel Qureshi
2019 — conf
A Radiation-Tolerant CML Voltage Controlled Oscillator in 28nm CMOS FDSOI.
CCECE
Jaime Cardenas, Abdul Khan, Li Chen, Zhichao Zhang, Muhammad Khan
2018 — conf
A Hardened-By-Design Technique for LC-Tank Voltage Controlled Oscillator.
CCECE
Zhichao Zhang, Li Chen, Hormoz Djahanshahi
2018 — conf
A SEE Insensitive CML Voltage Controlled Oscillator in 65nm CMOS.
CCECE
Zhichao Zhang, Li Chen, Hormoz Djahanshahi
2018 J jnl
A single event upset tolerant latch design.
Microelectron. Reliab.
Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li, Gang Guo, Li Chen, Sang H. Baeg
2018 J jnl
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.
Microelectron. Reliab.
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2017 C conf
BPPT - Bulk potential protection technique for hardened sequentials.
IOLTS
Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
2017 J jnl
SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology.
Microelectron. Reliab.
Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu
2017 J jnl
Wide range linearity improvement technique for linear wideband LNA.
IEICE Electron. Express
Zhichao Zhang, Anh Dinh, Li Chen, Haibin Wang
2016 J jnl
A 0.1-8 GHz wideband low-noise amplifier exploiting gain-enhanced noise-cancelling technique.
IEICE Electron. Express
Zhichao Zhang, Anh Dinh, Li Chen
2016 J jnl
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets.
J. Electron. Test.
Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen
2016 J jnl
A Built-in Single Event Upsets Detector for Sequential Cells.
J. Electron. Test.
Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen
2016 J jnl
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology.
J. Electron. Test.
Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li
2016 J jnl
Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory.
J. Electron. Test.
Qingyu Chen, Li Chen, Haibin Wang, Longsheng Wu, Yuanqing Li, Xing Zhao, Mo Chen
2016 J jnl
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits.
J. Electron. Test.
Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen, Gang Guo
2016 — conf
Single photon absorption laser facility for single event effect testing.
CCECE
Michael Newton, Brook Danger, Li Chen, Ramaswami Sammynaiken, Haibin Wang, David M. Hiemstra, Valeri Kirischian
2016 — conf
Total ionizing dose test facilities for micro-electronic circuits.
CCECE
Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian
2015 J jnl
A Novel Built-in Current Sensor for N-WELL SET Detection.
J. Electron. Test.
Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li
2015 — conf
A novel asymmetrical SRAM cell tolerant to soft errors.
CCECE
Lixiang Li, Yuanqing Li, Yuan Ma, Li Chen
2015 — conf
Analysis of advanced circuits for SET measurement.
IRPS
Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung
2015 J jnl
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology.
J. Electron. Test.
Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen
2014 C conf
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.
IOLTS
Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong
2014 J jnl
Single Event Resilient Dynamic Logic Designs.
J. Electron. Test.
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
2014 J jnl
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.
J. Electron. Test.
Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
2014 J jnl
The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits.
J. Electron. Test.
Yi Ren, Li Chen
2013 J jnl
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients.
J. Electron. Test.
Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken
2013 J jnl
A high linear broadband cascode LNA employing common-gate linearity enhancing technology.
IEICE Electron. Express
Zhichao Zhang, Muhammad Raashid Khan, Anh Dinh, Li Chen
2013 J jnl
A low noise figure 2-GHz bandwidth LNA using resistive feedback with additional input inductors.
IEICE Electron. Express
Zhichao Zhang, Anh Dinh, Li Chen, Muhammad Raashid Khan
2013 J jnl
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.
J. Electron. Test.
Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
2013 C conf
Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance.
PRDC
Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong
2012 — conf
A 2 GHz bandwidth LNA using resistive feedback with added inductor.
ICUWB
Zhichao Zhang, Anh Dinh, Li Chen
2012 — conf
A broadband high linear LNA for GSM/LTE wireless communications.
CCECE
Zhichao Zhang, Muhammad Raashid Khan, Li Chen, Anh Dinh
2012 J jnl
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.
J. Electron. Test.
Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva
2010 — conf
A new Bulk Built-In Current Sensing circuit for single-event transient detection.
CCECE
Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang
2010 — conf
A wearable real-time fall detector based on Naive Bayes classifier.
CCECE
Xiuxin Yang, Anh Dinh, Li Chen