| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | — | conf |
DSN Workshops
|
| 2017 | J | jnl |
IEEE Trans. Image Process.
|
| 2016 | C | conf |
ISCAS
|
| 2016 | A* | conf |
DAC
|
| 2015 | — | conf |
ICCVE
|
| 2015 | — | conf |
ICCE-TW
|
| 2014 | — | conf |
ESSCIRC
|
| 2014 | — | conf |
VLSI-DAT
|
| 2014 | J | jnl |
IEEE Des. Test
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | — | conf |
ESSCIRC
|
| 2013 | A | conf |
ITC
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | conf |
APCCAS
|
| 2007 | J | jnl |
IET Circuits Devices Syst.
|
| 2006 | — | conf |
ISSCC
|
| 2005 | — | conf |
CICC
|
| 2005 | — | conf |
ISCAS (6)
|
| 2003 | — | conf |
ESSCIRC
|
| 1998 | — | conf |
ICC
|
| 1997 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1996 | — | conf |
Asian Test Symposium
|
| 1996 | — | conf |
Asian Test Symposium
|
| 1995 | — | conf |
ED&TC
|