| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2012 | — | conf |
VLSI-DAT
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | A* | conf |
DAC
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | — | conf |
Area and Test Cost Reduction for On-Chip Wireless Test Channels with System-Level Design Techniques.
ATS
|
| 2007 | — | conf |
ATS
|
| 2007 | — | conf |
SoCC
|
| 2006 | — | conf |
ATS
|
| 2004 | — | conf |
MTDT
|
| 2004 | A | conf |
ITC
|
| 2003 | — | conf |
MTDT
|