Li-C. Wang - RankMe

194 papers A* 19A 64B 1C 4Misc 17Journal 35Unranked 49

Year	Rank	Type	Title / Venue / Authors
2025	A	`conf`	IEA-Plugin: An AI Agent Reasoner for Test Data Analytics. ITC Seoyeon Kim, Yu Su, Li-C. Wang
2025	J	`jnl`	IEA-Plugin: An AI Agent Reasoner for Test Data Analytics. CoRR Seoyeon Kim, Yu Su, Li-C. Wang
2025	A*	`conf`	LLMs Meet Post-Silicon Test Engineering: A New Era (Invited). DAC Li-C. Wang
2024	—	`conf`	LLM-Assisted Analytics in Semiconductor Test (Invited). MLCAD Li-C. Wang
2024	J	`jnl`	Oracle-Checker Scheme for Evaluating a Generative Large Language Model. CoRR Yueling Jenny Zeng, Li-C. Wang, Thomas Ibbetson
2024	A	`conf`	WM-Graph: Graph-Based Approach for Wafermap Analytics. ITC Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
2023	J	`jnl`	Domain Knowledge Graph Construction Via A Simple Checker. CoRR Yueling Zeng, Li-C. Wang
2023	A	`conf`	IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. ITC Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang
2023	A	`conf`	Welcome Message ITC 2023. ITC Li-C. Wang, Jeff Rearick
2022	A	`conf`	Language Driven Analytics for Failure Pattern Feedforward and Feedback. ITC Min Jian Yang, Yueling Zeng, Li-C. Wang
2022	—	`conf`	Wafer Map Pattern Analytics Driven By Natural Language Queries. ITC-Asia Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang
2021	A	`conf`	MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification. ITC Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan
2020	A	`conf`	Learning A Wafer Feature With One Training Sample. ITC Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa
2019	A	`conf`	Deploying A Machine Learning Solution As A Surrogate. ITC Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa
2019	A	`conf`	Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper. ICCAD Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba
2019	—	`conf`	Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2019	Misc	`conf`	Wafer Pattern Recognition Using Tucker Decomposition. VTS Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa
2019	—	`conf`	Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018	J	`jnl`	A Concept Learning Tool Based On Calculating Version Space Cardinality. CoRR Kuo-Kai Hsieh, Li-C. Wang
2018	A	`conf`	An Autonomous System View To Apply Machine Learning. ITC Li-C. Wang
2018	A	`conf`	Concept Recognition in Production Yield Data Analytics. ITC Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018	J	`jnl`	Discovering Interesting Plots in Production Yield Data Analytics. CoRR Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa
2018	—	`conf`	Machine Learning for Feature-Based Analytics. ISPD Li-C. Wang
2018	Misc	`conf`	Special session on machine learning for test and diagnosis. VTS Krishnendu Chakrabarty, Li-C. Wang, Gaurav Veda, Yu Huang
2017	J	`jnl`	Challenges and Trends in Modern SoC Design Verification. IEEE Des. Test Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang
2017	—	`conf`	Dynamic Exerciser Template Weighting in x86 Processor Verification. MTV Ahmed Wahba, Justin Hohnerlein, Farhan Rahman, Li-C. Wang
2017	J	`jnl`	Experience of Data Analytics in EDA and Test - Principles, Promises, and Challenges. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Li-C. Wang
2017	—	`conf`	Feature extraction from design documents to enable rule learning for improving assertion coverage. ASP-DAC Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra
2017	J	`jnl`	Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification. IEEE Des. Test Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang
2017	A	`conf`	Kernel based clustering for quality improvement and excursion detection. ITC Nik Sumikawa, Matt Nero, Li-C. Wang
2017	Misc	`conf`	Learning the process for correlation analysis. VTS Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg
2017	A*	`conf`	Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery. DAC Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra
2017	A	`conf`	Some considerations on choosing an outlier method for automotive product lines. ITC Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg
2017	A	`conf`	Systematic defect detection methodology for volume diagnosis: A data mining perspective. ITC Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang
2016	Misc	`conf`	Consistency in wafer based outlier screening. VTS Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli
2016	J	`jnl`	ITC and the Future of Test - We've Won. IEEE Des. Test Ron Press, Li-C. Wang
2016	Misc	`conf`	Session 4B - Panel data analytics in semiconductor manufacturing. VTS Suriyaprakash Natarajan, Li-C. Wang
2015	—	`conf`	Data mining in functional test content optimization. ASP-DAC Li-C. Wang
2015	A	`conf`	Generalization of an outlier model into a "global" perspective. ITC Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch
2015	—	`conf`	Machine Learning in Simulation-Based Analysis. ISPD Li-C. Wang, Malgorzata Marek-Sadowska
2014	A*	`conf`	Data Mining In EDA - Basic Principles, Promises, and Constraints. DAC Li-C. Wang, Magdy S. Abadir
2014	—	`conf`	Design trends and test challenges in automotive electronics. VLSI-DAT Li-C. Wang
2014	C	`conf`	Multivariate outlier modeling for capturing customer returns - How simple it can be. IOLTS Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2014	A	`conf`	On application of data mining in functional debug. ICCAD Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, Jayanta Bhadra
2014	A	`conf`	Yield optimization using advanced statistical correlation methods. ITC Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2013	A	`conf`	A pattern mining framework for inter-wafer abnormality analysis. ITC Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2013	—	`conf`	Analyzing Efficacy of Constrained Test Program Generators - A Case Study. MTV Vinayak Kamath, Farhan Rahman, Li-C. Wang
2013	—	`conf`	Data mining in design and test processes: basic principles and promises. ISPD Li-C. Wang
2013	J	`jnl`	Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs. J. Electron. Test. Sandip Ray, Jay Bhadra, Magdy S. Abadir, Li-C. Wang
2013	—	`conf`	Novel test analysis to improve structural coverage - A commercial experiment. VLSI-DAT Wen Chen, Li-C. Wang, Jayanta Bhadra, Magdy S. Abadir
2013	A*	`conf`	Simulation knowledge extraction and reuse in constrained random processor verification. DAC Wen Chen, Li-C. Wang, Jay Bhadra, Magdy S. Abadir
2012	A	`conf`	An experiment of burn-in time reduction based on parametric test analysis. ITC Nik Sumikawa, Li-C. Wang, Magdy S. Abadir
2012	—	`conf`	Data mining based prediction paradigm and its applications in design automation. VLSI-DAT Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang
2012	—	`conf`	Foreword. VLSI-DAT An-Yeu Wu, Li-C. Wang
2012	A	`conf`	Functional test content optimization for peak-power validation - An experimental study. ITC Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang
2012	J	`jnl`	Introduction to special section on verification challenges in the concurrent world. ACM Trans. Design Autom. Electr. Syst. Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Aarti Gupta
2012	A	`conf`	Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir
2012	A	`conf`	Screening customer returns with multivariate test analysis. ITC Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011	—	`ed.`	12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011 MTV Magdy S. Abadir, Jay Bhadra, Li-C. Wang
2011	A	`conf`	Forward prediction based on wafer sort data - A case study. ITC Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011	A	`conf`	Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
2011	Misc	`conf`	Understanding customer returns from a test perspective. VTS Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2010	—	`ed.`	11th International Workshop on Microprocessor Test and Verification, MTV 2010, Austin, TX, USA, December 13-15, 2010 MTV Magdy S. Abadir, Jay Bhadra, Li-C. Wang
2010	A	`conf`	A kernel-based approach for functional test program generation. ITC Po-Hsien Chang, Li-C. Wang, Jayanta Bhadra
2010	C	`conf`	A new sampling method for analog behavioral modeling. ISCAS Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang
2010	—	`conf`	A non-parametric approach to behavioral device modeling. ISQED Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang
2010	—	`conf`	Analog behavioral modeling flow using statistical learning method. ISQED Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang
2010	—	`conf`	Automatic assertion extraction via sequential data mining of simulation traces. ASP-DAC Po-Hsien Chang, Li-C. Wang
2010	A*	`conf`	Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch. DAC Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir
2010	—	`conf`	Correlating system test Fmax with structural test Fmax and process monitoring measurements. ASP-DAC Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja
2010	—	`conf`	Data learning based diagnosis. ASP-DAC Li-C. Wang
2010	J	`jnl`	Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch. IEEE Des. Test Comput. Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir
2010	Misc	`conf`	Impact of multiple input switching on delay test under process variation. VTS Sean H. Wu, Sreejit Chakravarty, Li-C. Wang
2010	J	`jnl`	Increasing the Efficiency of Simulation-Based Functional Verification Through Unsupervised Support Vector Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster
2010	A	`conf`	Mining AC delay measurements for understanding speed-limiting paths. ITC Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja
2010	—	`conf`	On evaluating speed path detection of structural tests. ISQED Jing Zeng, Jing Wang, Chia-Ying Chen, Michael Mateja, Li-C. Wang
2010	A	`conf`	Online selection of effective functional test programs based on novelty detection. ICCAD Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang
2010	Misc	`conf`	Selecting the most relevant structural Fmax for system Fmax correlation. VTS Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja
2009	J	`jnl`	A Statistical Diagnosis Approach for Analyzing Design-Silicon Timing Mismatch. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Nicholas Callegari, Pouria Bastani, Li-C. Wang, Magdy S. Abadir
2009	—	`conf`	Data Learning Techniques for Functional/System Fmax Prediction. DFT Li-C. Wang
2009	A	`conf`	Data learning techniques and methodology for Fmax prediction. ITC Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja
2009	A	`conf`	Feature based similarity search with application to speedpath analysis. ITC Nicholas Callegari, Li-C. Wang, Pouria Bastani
2009	A	`conf`	Minimizing outlier delay test cost in the presence of systematic variability. ITC Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir
2009	—	`conf`	Path selection for monitoring unexpected systematic timing effects. ASP-DAC Nicholas Callegari, Pouria Bastani, Li-C. Wang, Sreejit Chakravarty, Alexander Tetelbaum
2009	A*	`conf`	Predicting variability in nanoscale lithography processes. DAC Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang
2009	A*	`conf`	Speedpath analysis based on hypothesis pruning and ranking. DAC Nicholas Callegari, Li-C. Wang, Pouria Bastani
2008	J	`jnl`	A Clock-Less Jitter Spectral Analysis Technique. IEEE Trans. Circuits Syst. I Regul. Pap. Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang
2008	A	`conf`	A Study of Outlier Analysis Techniques for Delay Testing. ITC Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang
2008	A	`conf`	Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained. ITC Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir
2008	A*	`conf`	Functional test selection based on unsupervised support vector analysis. DAC Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster
2008	J	`jnl`	Linking Statistical Learning to Diagnosis. IEEE Des. Test Comput. Pouria Bastani, Li-C. Wang, Magdy S. Abadir
2008	—	`conf`	Refining Delay Test Methodology Using Knowledge of Asymmetric Transition Delay. ATS Sean H. Wu, Sreejit Chakravarty, Alexander Tetelbaum, Li-C. Wang
2008	A*	`conf`	Speedpath prediction based on learning from a small set of examples. DAC Pouria Bastani, Kip Killpack, Li-C. Wang, Eli Chiprout
2008	A*	`conf`	Statistical diagnosis of unmodeled systematic timing effects. DAC Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir
2007	J	`jnl`	A Survey of Hybrid Techniques for Functional Verification. IEEE Des. Test Comput. Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Sandip Ray
2007	A	`conf`	An incremental learning framework for estimating signal controllability in unit-level verification. ICCAD Charles H.-P. Wen, Li-C. Wang, Jayanta Bhadra
2007	A	`conf`	Analyzing the risk of timing modeling based on path delay tests. ITC Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir
2007	—	`conf`	Coverage-directed test generation through automatic constraint extraction. HLDVT Onur Guzey, Li-C. Wang
2007	A*	`conf`	Design-Silicon Timing Correlation A Data Mining Perspective. DAC Li-C. Wang, Pouria Bastani, Magdy S. Abadir
2007	—	`ed.`	Eighth International Workshop on Microprocessor Test and Verification (MTV 2007), Common Challenges and Solutions, 5-6 December 2007, Austin, Texas, USA MTV Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra
2007	A	`conf`	Enhancing signal controllability in functional test-benches through automatic constraint extraction. ITC Onur Guzey, Li-C. Wang, Jayanta Bhadra
2007	J	`jnl`	Guest Editors' Introduction: Attacking Functional Verification through Hybrid Techniques. IEEE Des. Test Comput. Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang
2007	A	`conf`	Statistical analysis and optimization of parametric delay test. ITC Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir
2006	A	`conf`	An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space. ITC Leonard Lee, Li-C. Wang
2006	—	`conf`	Extracting a Simplified View of Design Functionality Based on Vector Simulation. Haifa Verification Conference Onur Guzey, Charles H.-P. Wen, Li-C. Wang, Tao Feng, Hillel Miller, Magdy S. Abadir
2006	—	`conf`	Extracting a simplified view of design functionality via vector simulation. HLDVT Onur Guzey, Charles H.-P. Wen, Li-C. Wang, Tao Feng, Magdy S. Abadir
2006	A	`conf`	Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective. ITC Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir
2006	A	`conf`	On bounding the delay of a critical path. ICCAD Leonard Lee, Li-C. Wang
2006	A*	`conf`	Refined statistical static timing analysis through. DAC Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir
2006	—	`ed.`	Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA MTV Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra
2006	J	`jnl`	Simulation-Based Functional Test Generation for Embedded Processors. IEEE Trans. Computers Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng
2006	C	`conf`	Simulation-based functional test justification using a decision-digram-based Boolean data miner. ICCD Charles H.-P. Wen, Onur Guzey, Li-C. Wang
2005	A	`conf`	An Efficient Sequential SAT Solver With Improved Search Strategies. DATE Feng Lu, Madhu K. Iyer, Ganapathy Parthasarathy, Li-C. Wang, Kwang-Ting Cheng, Kuang-Chien Chen
2005	A	`conf`	Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects. ITC Benjamin N. Lee, Hui Li, Li-C. Wang, Magdy S. Abadir
2005	Misc	`conf`	On A Software-Based Self-Test Methodology and Its Application. VTS Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang, Wei-Ting Liu, Ji-Jan Chen
2005	—	`conf`	On Generating Tests to Cover Diverse Worst-Case Timing Corners. DFT Leonard Lee, Sean H. Wu, Charles H.-P. Wen, Li-C. Wang
2005	Misc	`conf`	On Silicon-Based Speed Path Identification. VTS Leonard Lee, Li-C. Wang, Praveen Parvathala, T. M. Mak
2005	Misc	`conf`	Reducing Pattern Delay Variations for Screening Frequency Dependent Defects. VTS Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir
2005	—	`conf`	Simulation Data Mining for Functional Test Pattern Justification. MTV Charles H.-P. Wen, Li-C. Wang
2005	—	`conf`	Simulation-based functional test generation for embedded processors. HLDVT Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng
2005	A	`conf`	Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology. ITC Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Wei-Ting Liu, Ji-Jan Chen
2005	—	`ed.`	Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), Common Challenges and Solutions, 3-4 November 2005, Austin, Texas, USA MTV Magdy S. Abadir, Li-C. Wang
2005	J	`jnl`	Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator. ACM Trans. Design Autom. Electr. Syst. Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin
2004	Misc	`conf`	A Scalable On-Chip Jitter Extraction Technique. VTS Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang
2004	J	`jnl`	A Signal Correlation Guided Circuit-SAT Solver. J. Univers. Comput. Sci. Feng Lu, Li-C. Wang, Kwang-Ting (Tim) Cheng, John Moondanos, Ziyad Hanna
2004	J	`jnl`	A new sigma-delta modulator architecture for testing using digital stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. Chee-Kian Ong, Kwang-Ting Cheng, Li-C. Wang
2004	A	`conf`	A path-based methodology for post-silicon timing validation. ICCAD Leonard Lee, Li-C. Wang, T. M. Mak, Kwang-Ting Cheng
2004	A*	`conf`	An efficient finite-domain constraint solver for circuits. DAC Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2004	J	`jnl`	Critical path selection for delay fault testing based upon a statistical timing model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng
2004	—	`conf`	Efficient reachability checking using sequential SAT. ASP-DAC Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2004	J	`jnl`	Guest Editors' Introduction: The Verification and Test of Complex Digital ICs. IEEE Des. Test Comput. Magdy S. Abadir, Li-C. Wang
2004	A	`conf`	Improved Symoblic Simulation by Dynamic Funtional Space Partitioning. DATE Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin
2004	—	`conf`	Improved symbolic simulation by functional-space decomposition. ASP-DAC Tao Feng, Li-C. Wang, Kwang-Ting Cheng
2004	—	`conf`	Jitter spectral extraction for multi-gigahertz signal. ASP-DAC Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang
2004	J	`jnl`	Multilevel circuit clustering for delay minimization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Cliff C. N. Sze, Ting-Chi Wang, Li-C. Wang
2004	J	`jnl`	New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. IEEE Des. Test Comput. T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang
2004	A	`conf`	On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. ITC Jing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham
2004	—	`conf`	On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. MTV Jing Zeng, Magdy S. Abadir, G. Vandling, Li-C. Wang, S. Karako, Jacob A. Abraham
2004	A*	`conf`	On path-based learning and its applications in delay test and diagnosis. DAC Li-C. Wang, T. M. Mak, Kwang-Ting Cheng, Magdy S. Abadir
2004	—	`conf`	On using a 2-domain partitioned OBDD data structure in verification. HLDVT Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Andy Lin
2004	A	`conf`	Pattern Selection for Testing of Deep Sub-Micron Timing Defects. DATE Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng
2004	A	`conf`	Random Jitter Extraction Technique in a Multi-Gigahertz Signal. DATE Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang
2004	A	`conf`	Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation. DATE Li-C. Wang
2004	J	`jnl`	Safety Property Verification Using Sequential SAT and Bounded Model Checking. IEEE Des. Test Comput. Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2004	A	`conf`	Static statistical timing analysis for latch-based pipeline designs. ICCAD Rob A. Rutenbar, Li-C. Wang, Kwang-Ting Cheng, Sandip Kundu
2004	—	`conf`	TranGen: a SAT-based ATPG for path-oriented transition faults. ASP-DAC Kai Yang, Kwang-Ting Cheng, Li-C. Wang
2003	A	`conf`	A Circuit SAT Solver With Signal Correlation Guided Learning. DATE Feng Lu, Li-C. Wang, Kwang-Ting Cheng, Ric C.-Y. Huang
2003	—	`conf`	A comparison of BDDs, BMC, and sequential SAT for model checking. HLDVT Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang
2003	A*	`conf`	A signal correlation guided ATPG solver and its applications for solving difficult industrial cases. DAC Feng Lu, Li-C. Wang, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna
2003	J	`jnl`	Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting (Tim) Cheng
2003	A	`conf`	Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. DATE Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir
2003	—	`conf`	Delta-sigma modulator based mixed-signal BIST architecture for SoC. ASP-DAC Chee-Kian Ong, Kwang-Ting (Tim) Cheng, Li-C. Wang
2003	Misc	`conf`	Diagnosis of Delay Defects Using Statistical Timing Models. VTS Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou
2003	A	`conf`	Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. ITC Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak
2003	J	`jnl`	Enhanced Symbolic Simulation for Functional Verification of Embedded Array Systems. Des. Autom. Embed. Syst. Li-C. Wang, Tao Feng, Kwang-Ting (Tim) Cheng, Magdy S. Abadir, Manish Pandey
2003	—	`conf`	Enhanced symbolic simulation for efficient verification of embedded array systems. ASP-DAC Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Manish Pandey, Magdy S. Abadir
2003	A*	`conf`	Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. DAC Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak
2003	—	`conf`	Experience in critical path selection for deep sub-micron delay test and timing validation. ASP-DAC Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting Cheng
2003	J	`jnl`	Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Des. Test Comput. Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang
2003	—	`conf`	On Structural vs. Functional Testing for Delay Faults. ISQED Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang
2003	A	`conf`	Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. ITC Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir
2002	A	`conf`	Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
2002	A	`conf`	Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems. ITC Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir
2002	A*	`conf`	Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
2002	A*	`conf`	False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation. DAC Jing-Jia Liou, Angela Krstic, Li-C. Wang, Kwang-Ting Cheng
2002	—	`conf`	Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. DFT Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer
2002	A	`conf`	On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. ITC Li-C. Wang, Magdy S. Abadir, Juhong Zhu
2002	A	`conf`	On theoretical and practical considerations of path selection for delay fault testing. ICCAD Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng
2002	—	`conf`	Validation and Verification of Complex Digital Systems: A Practical Perspective. LATW Li-C. Wang, Magdy S. Abadir
2001	Misc	`conf`	Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. VTS Magdy S. Abadir, Juhong Zhu, Li-C. Wang
2001	J	`jnl`	Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
2001	—	`conf`	Module placement with boundary constraints using the sequence-pair representation. ASP-DAC Jianbang Lai, Ming-Shiun Lin, Ting-Chi Wang, Li-C. Wang
2001	—	`conf`	Verification and Validation of Complex Digital Systems: An Industrial Perspective. ISQED Magdy S. Abadir, Li-C. Wang
2000	—	`conf`	Collaboration between Industry and Academia in Test Research. Asian Test Symposium Kwang-Ting Cheng, Vishwani D. Agrawal, Jing-Yang Jou, Li-C. Wang, Chi-Feng Wu, Shianling Wu
2000	A	`conf`	Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
2000	J	`jnl`	On Efficiently Producing Quality Tests for Custom Circuits in PowerPC J. Electron. Test. Li-C. Wang, Magdy S. Abadir
2000	—	`conf`	On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer
1999	J	`jnl`	Experience in Validation of PowerPCTM Microprocessor Embedded Arrays. J. Electron. Test. Li-C. Wang, Magdy S. Abadir
1999	A	`conf`	Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
1999	Misc	`conf`	REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
1999	A	`conf`	Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors. ITC Li-C. Wang, Magdy S. Abadir
1998	A*	`conf`	Automatic Generation of Assertions for Formal Verification of PowerPC Microprocessor Arrays Using Symbolic Trajectory Evaluation. DAC Li-C. Wang, Magdy S. Abadir, Nari Krishnamurthy
1998	A	`conf`	Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays. DATE Li-C. Wang, Magdy S. Abadir, Jing Zeng
1998	Misc	`conf`	On Logic and Transistor Level Design Error Detection of Various Validation Approaches for PowerPC(tm) Microprocessor Arrays. VTS Li-C. Wang, Magdy S. Abadir, Jing Zeng
1998	J	`jnl`	On measuring the effectiveness of various design validation approaches for PowerPC microprocessor embedded arrays. ACM Trans. Design Autom. Electr. Syst. Li-C. Wang, Magdy S. Abadir, Jing Zeng
1998	—	`conf`	Practical Considerations in Formal Equivalence Checking of PowerPC(tm) Microprocessors. Great Lakes Symposium on VLSI Arun Chandra, Li-C. Wang, Magdy S. Abadir
1998	J	`jnl`	Test Generation Based on High-Level Assertion Specification for PowerPCTM Microprocessor Embedded Arrays. J. Electron. Test. Li-C. Wang, Magdy S. Abadir
1997	A	`conf`	A New Validation Methodology Combining Test and Formal Verification for PowerPC ITC Li-C. Wang, Magdy S. Abadir
1996	C	`conf`	A Better ATPG Algorithm and Its Design Principles. ICCD Li-C. Wang, M. Ray Mercer, Thomas W. Williams
1996	A	`conf`	Using Target Faults To Detect Non-Tartget Defects. ITC Li-C. Wang, M. Ray Mercer, Thomas W. Williams
1995	—	`conf`	Enhanced testing performance via unbiased test sets. ED&TC Li-C. Wang, M. Ray Mercer, Thomas W. Williams
1995	A	`conf`	On Efficiently and Reliably Achieving Low Defective Part Levels. ITC Li-C. Wang, M. Ray Mercer, Thomas W. Williams
1995	Misc	`conf`	On the decline of testing efficiency as fault coverage approaches 100%. VTS Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams
1993	B	`conf`	Experience in Massively Parallel Discrete Event Simulation. SPAA Albert G. Greenberg, Boris D. Lubachevsky, Li-C. Wang