Letícia Maria Bolzani Poehls

23 papers A 1B 1C 4Misc 1Journal 7Unranked 9

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime. LATS Thiago Santos Copetti, Supriya Chakraborty, Letícia Maria Bolzani Poehls
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	A	`conf`	Neuromorphic Edge Computing: Challenges, Opportunities, and Current Solutions. ISLPED Federico Corradi, Amir Zjajo, Letícia Maria Bolzani Poehls, Milos Krstic, Orlando Moreira, Zeqi Zhu, Farhad Merchant
2024	C	`conf`	Understanding Transistor Aging Impact on the Behavior of RRAM Cells. VLSI-SoC Seyed Hossein Hashemi Shadmehri, Supriya Chakraborty, Thiago Santos Copetti, Fabian Luis Vargas, Letícia Maria Bolzani Poehls
2022	—	`conf`	Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. LATS Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls
2021	J	`jnl`	Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen
2021	J	`jnl`	Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui
2017	C	`conf`	Analyzing the behavior of FinFET SRAMs with resistive defects. VLSI-SoC Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls
2017	—	`conf`	Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. VLSI-SoC (Selected Papers) Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen
2016	—	`conf`	Analyzing NBTI impact on SRAMs with resistive-open defects. LATS M. Tulio Martins, Guilherme Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls
2016	J	`jnl`	Selected Peer Reviewed Articles from the 17th "IEEE Latin-American Test Symposium, " Foz do Iguaçu, Brazil, April 6-8, 2016. J. Low Power Electron. Letícia Maria Bolzani Poehls
2015	Misc	`conf`	Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs. VLSID Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii
2015	—	`conf`	NBTI-aware design of integrated circuits: a hardware-based approach. LATS Thiago Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas
2014	J	`jnl`	An On-Chip Sensor to Monitor NBTI Effects in SRAMs. J. Electron. Test. Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes
2014	—	`conf`	Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti
2014	J	`jnl`	Selected Peer-Reviewed Articles from the 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013. J. Low Power Electron. Letícia Maria Bolzani Poehls, Matteo Sonza Reorda
2013	C	`conf`	Identifying NBTI-Critical Paths in Nanoscale Logic. DSD Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls
2013	—	`conf`	Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. EMC Compo C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer
2012	J	`jnl`	A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation. J. Electron. Test. Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez
2012	J	`jnl`	Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. J. Electron. Test. Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, N. Marroni, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas
2012	C	`conf`	On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. DDECS Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas
2011	—	`conf`	Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity. LATW Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Sebastián E. García, Edmundo Gatti, Fernando Hernandez, Ney Laert Vilar Calazans
2011	—	`conf`	Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study. LATW Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas