Leticia Bolzani Poehls

17 papers B 3C 1Journal 6Unranked 7

Year	Rank	Type	Title / Venue / Authors
2025	C	`conf`	AIDA4Edge: Twinning for Excellence in Adaptive Edge Artificial Intelligence. DSD Marko S. Andjelkovic, Rizwan Tariq Syed, Alessandro Veronesi, Fabian Vargas, Markus Ulbricht, Leticia Bolzani Poehls, Milos Krstic, Davide Bertozzi, Edward G. Jones, Oliver Rhodes, Riccardo Zese, Michele Favalli, Alice Bizzarri, Evelina Lamma, Marco Gavanelli, Elena Bellodi, Zoran Peric, Jelena Nikolic, Milan R. Dincic, Aleksandra Jovanovic, Dejan Ciric, Nikola Vucic, Sofija Peric, Jelena Jovanovic, Milica Stojanovic, Tatjana R. Nikolic, Goran Nikolic, Jelena Nedeljkovic, Danijel Dankovic, Emilija Zivanovic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Bratislav Predic, Tamara Milovanovic
2025	B	`conf`	In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. ETS Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui
2024	J	`jnl`	A Fully Automated Platform for Evaluating ReRAM Crossbars. CoRR Rebecca Pelke, Felix Staudigl, Niklas Thomas, Nils Bosbach, Mohammed Hossein, José Cubero-Cascante, Leticia Bolzani Poehls, Rainer Leupers, Jan Moritz Joseph
2023	J	`jnl`	Fault Injection in Native Logic-in-Memory Computation on Neuromorphic Hardware. CoRR Felix Staudigl, Thorben Fetz, Rebecca Pelke, Dominik Sisejkovic, Jan Moritz Joseph, Leticia Bolzani Poehls, Rainer Leupers
2021	B	`conf`	Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
2020	J	`jnl`	Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
2020	—	`conf`	Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen
2019	—	`conf`	A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
2019	B	`conf`	DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
2019	J	`jnl`	Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2018	—	`conf`	A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. LATS George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls
2018	—	`conf`	A path energy control technique for energy efficiency on wireless sensor networks. LASCAS F. Tubiello, Leticia Bolzani Poehls, Thais Webber, César Augusto Missio Marcon, Fabian Vargas
2018	—	`conf`	Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS Guilherme Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
2016	—	`conf`	Gate-level modelling of NBTI-induced delays under process variations. LATS Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
2016	J	`jnl`	Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
2016	J	`jnl`	NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. J. Electron. Test. Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas
2015	—	`conf`	On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment. EMC Compo Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas