LeRoy Winemberg

38 papers A* 1A 12B 2C 1Misc 8Journal 9Unranked 5

Year	Rank	Type	Title / Venue / Authors
2021	J	`jnl`	Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. ACM Trans. Design Autom. Electr. Syst. Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2019	B	`conf`	Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. ETS Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2017	A	`conf`	Built-in self-test for stability measurement of low dropout regulator. ITC Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev
2017	J	`jnl`	Design of Reliable SoCs With BIST Hardware and Machine Learning. IEEE Trans. Very Large Scale Integr. Syst. Mehdi Sadi, Gustavo K. Contreras, Jifeng Chen, LeRoy Winemberg, Mark Tehranipoor
2017	—	`conf`	Evaluation of loop transfer function based dynamic testing of LDOs. ITC-Asia Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev
2017	Misc	`conf`	Learning the process for correlation analysis. VTS Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg
2017	J	`jnl`	SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Mehdi Sadi, Sukeshwar Kannan, LeRoy Winemberg, Mark Tehranipoor
2017	A	`conf`	Some considerations on choosing an outlier method for automotive product lines. ITC Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg
2017	J	`jnl`	TRO: An On-Chip Ring Oscillator-Based GHz Transient IR-Drop Monitor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Xiaoxiao Wang, Pengyuan Jiao, Mehdi Sadi, Donglin Su, LeRoy Winemberg, Mark Tehranipoor
2017	J	`jnl`	Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. IEEE Trans. Very Large Scale Integr. Syst. Miao Tony He, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, Mark Tehranipoor
2016	J	`jnl`	A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. Xiaoxiao Wang, Dongrong Zhang, Donglin Su, LeRoy Winemberg, Mark Tehranipoor
2016	C	`conf`	An efficient all-digital IR-Drop Alarmer for DVFS-based SoC. ISCAS Liting Yu, Xiaoxiao Wang, Yuanqing Cheng, Xiaoying Zhao, Pengyuan Jiao, Aixin Chen, Donglin Su, LeRoy Winemberg, Mehdi Sadi, Mark Tehranipoor
2016	A	`conf`	BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning. ITC Mehdi Sadi, Gustavo K. Contreras, Dat Tran, Jifeng Chen, LeRoy Winemberg, Mark Tehranipoor
2016	A	`conf`	Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ITC Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak
2016	Misc	`conf`	Test-point insertion efficiency analysis for LBIST applications. VTS Miao Tony He, Gustavo K. Contreras, Mark Tehranipoor, Dat Tran, LeRoy Winemberg
2015	Misc	`conf`	A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs. VTS Mehdi Sadi, LeRoy Winemberg, Mark Tehranipoor
2015	J	`jnl`	Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Xiaoxiao Wang, LeRoy Winemberg, Donglin Su, Dat Tran, Saji George, Nisar Ahmed, Steve Palosh, Allan Dobin, Mark Tehranipoor
2015	A	`conf`	Generalization of an outlier model into a "global" perspective. ITC Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch
2015	—	`conf`	LBIST pattern reduction by learning ATPG test cube properties. ISQED Gustavo K. Contreras, Yang Zhao, Nisar Ahmed, LeRoy Winemberg, Mohammad Tehranipoor
2015	—	`conf`	Predictive LBIST model and partial ATPG for seed extraction. DFTS Gustavo K. Contreras, Nisar Ahmed, LeRoy Winemberg, Mark Tehranipoor
2015	—	`conf`	Speed Binning Using Machine Learning And On-chip Slack Sensors. ACM Great Lakes Symposium on VLSI Mehdi Sadi, Mark Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg
2014	Misc	`conf`	Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. VTS Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor
2014	—	`conf`	On-chip sensor selection for effective speed-binning. MWSCAS Qihang Shi, Mohammad Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg
2013	J	`jnl`	Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electron. Test. Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
2013	A	`conf`	Fault analysis and simulation of large scale industrial mixed-signal circuits. DATE Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev
2012	J	`jnl`	Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements. IEEE Trans. Very Large Scale Integr. Syst. Xiaoxiao Wang, Mohammad Tehranipoor, Saji George, Dat Tran, LeRoy Winemberg
2012	A	`conf`	Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. ITC Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor
2012	A	`conf`	Screening customer returns with multivariate test analysis. ITC Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011	Misc	`conf`	Case Study: Efficient SDD test generation for very large integrated circuits. VTS Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor
2011	B	`conf`	Critical Fault-Based Pattern Generation for Screening SDDs. ETS Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
2011	A	`conf`	Forward prediction based on wafer sort data - A case study. ITC Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2011	A*	`conf`	In-field aging measurement and calibration for power-performance optimization. DAC Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg
2011	A	`conf`	Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir
2011	Misc	`conf`	Special session 5B: Panel How much toggle activity should we be testing with? VTS Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg
2011	Misc	`conf`	Special session: Hot topic: Smart silicon. VTS LeRoy Winemberg, Mohammad Tehranipoor
2011	Misc	`conf`	Understanding customer returns from a test perspective. VTS Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir
2010	A	`conf`	Detecting and diagnosing open defects. ITC Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson
2005	A	`conf`	Outsourcing DFT: it can be done but it isn't easy. ITC LeRoy Winemberg