Leonardo Heitich Brendler

15 papers C 4Journal 2Unranked 9

Year	Rank	Type	Title / Venue / Authors
2023	—	`conf`	A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. SBCCI Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt
2023	—	`conf`	A MCU-robust Interleaved Data/Detection SRAM for Space Environments. ISVLSI Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet
2023	J	`jnl`	A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications. IEEE Trans. Circuits Syst. I Regul. Pap. Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet
2023	—	`conf`	A Tool for Automatic Radiation-Hardened SRAM Layout Generation. ICECS Leonardo Heitich Brendler, Hervé Lapuyade, Yann Deval, Ricardo Reis, François Rivet
2023	C	`conf`	Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt
2021	—	`conf`	Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study. LATS Bernardo Borges Sandoval, Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Ricardo Reis, Cristina Meinhardt
2021	—	`conf`	Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit. LASCAS Leonardo Heitich Brendler, Alexandra L. Zimpeck, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis
2020	—	`conf`	Circuit Level Design Methods to Mitigate Soft Errors. LATS Ricardo A. L. Reis, Cristina Meinhardt, Alexandra L. Zimpeck, Leonardo Heitich Brendler, Leonardo B. Moraes
2020	J	`jnl`	Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2020	—	`conf`	Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters. LATS Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis
2019	C	`conf`	Evaluation of SET under Process Variability on FinFET Multi-level Design. VLSI-SoC Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
2019	C	`conf`	Impact of Process Variability and Single Event Transient on FinFET Technology. VLSI-SoC Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis
2019	—	`conf`	Process Variability Impact on the SET Response of FinFET Multi-level Design. VLSI-SoC (Selected Papers) Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2018	C	`conf`	Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements. VLSI-SoC Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis
2018	—	`conf`	Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells. ICECS Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis