Leonardo Bonet Zordan

13 papers A 4B 2C 1Misc 1Journal 1Unranked 4
YearRankTypeTitle / Venue / Authors
2016 — conf
An effective BIST architecture for power-gating mechanisms in low-power SRAMs.
ISQED
Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo Bonet Zordan
2016 — conf
Design space exploration for complex automotive applications: an engine control system case study.
RAPIDO@HiPEAC
Khalid Latif, Manuel Selva, Charles Effiong, Roman Ursu, Abdoulaye Gamatié, Gilles Sassatelli, Leonardo Bonet Zordan, Luciano Ost, Piotr Dziurzanski, Leandro Soares Indrusiak
2016 B conf
Failure mechanisms and test methods for the SRAM TVC write-assist technique.
ETS
Josef Kinseher, Moritz Völker, Leonardo Bonet Zordan, Ilia Polian
2016 A conf
Improving SRAM test quality by leveraging self-timed circuits.
DATE
Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger
2015 — conf
On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs.
ATS
Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian
2014 J jnl
On the Test and Mitigation of Malfunctions in Low-Power SRAMs.
J. Electron. Test.
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Nabil Badereddine
2013 Misc conf
A built-in scheme for testing and repairing voltage regulators of low-power srams.
VTS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 A conf
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.
ITC
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 A conf
Test solution for data retention faults in low-power SRAMs.
DATE
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012 B conf
Defect analysis in power mode control logic of low-power SRAMs.
ETS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012 A conf
Low-power SRAMs power mode control logic: Failure analysis and test solutions.
ITC
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2011 — conf
Failure Analysis and Test Solutions for Low-Power SRAMs.
Asian Test Symposium
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine
2011 C conf
Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.
DDECS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine