Leo J. Ernst

19 papers Journal 19
YearRankTypeTitle / Venue / Authors
2012 J jnl
Characterization of the viscoelastic properties of an epoxy molding compound during cure.
Microelectron. Reliab.
M. Sadeghinia, Kaspar M. B. Jansen, Leo J. Ernst
2010 J jnl
A fast moisture sensitivity level qualification method.
Microelectron. Reliab.
Xiaosong Ma, Kaspar M. B. Jansen, G. Q. Zhang, Willem D. van Driel, Olaf van der Sluis, Leo J. Ernst, C. Regards, Christian Gautier, Hélène Frémont
2010 J jnl
Prediction of cure induced warpage of micro-electronic products.
Microelectron. Reliab.
Jan de Vreugd, Kaspar M. B. Jansen, Leo J. Ernst, C. Bohm
2009 J jnl
Modeling and characterization of molding compound properties during cure.
Microelectron. Reliab.
Kaspar M. B. Jansen, C. Qian, Leo J. Ernst, C. Bohm, A. Kessler, Harald Preu, Matthias Stecher
2007 J jnl
Characterization of moisture properties of polymers for IC packaging.
Microelectron. Reliab.
Xiaosong Ma, Kaspar M. B. Jansen, Leo J. Ernst, W. D. van Driel, Olaf van der Sluis, G. Q. Zhang
2007 J jnl
Correlation between chemistry of polymer building blocks and microelectronics reliability.
Microelectron. Reliab.
H. J. L. Bressers, W. D. van Driel, Kaspar M. B. Jansen, Leo J. Ernst, G. Q. Zhang
2007 J jnl
Effect of filler concentration of rubbery shear and bulk modulus of molding compounds.
Microelectron. Reliab.
Dao-Guo Yang, Kaspar M. B. Jansen, Leo J. Ernst, G. Q. Zhang, H. J. L. Bressers, J. H. J. Janssen
2007 J jnl
Influence of matrix viscoelastic properties on thermal conductivity of TCA - Numerical approach.
Microelectron. Reliab.
Tomasz Falat, Artur Wymyslowski, Jana Kolbe, Kaspar M. B. Jansen, Leo J. Ernst
2007 J jnl
Measuring the through-plane elastic modulus of thin polymer films in situ.
Microelectron. Reliab.
M. van Soestbergen, Leo J. Ernst, Kaspar M. B. Jansen, W. D. van Driel
2007 J jnl
Micro-mechanical testing of SiLK by nanoindentation and substrate curvature techniques.
Microelectron. Reliab.
Viktor Gonda, Kaspar M. B. Jansen, Leo J. Ernst, Jaap M. J. den Toonder, G. Q. Zhang
2007 J jnl
Molecular simulation on the material/interfacial strength of the low-dielectric materials.
Microelectron. Reliab.
Cadmus A. Yuan, Olaf van der Sluis, G. Q. (Kouchi) Zhang, Leo J. Ernst, Willem D. van Driel, Richard B. R. van Silfhout
2007 J jnl
Novel shear tools for viscoelastic characterization of packaging polymers.
Microelectron. Reliab.
C. van't Hof, Kaspar M. B. Jansen, G. Wisse, Leo J. Ernst, Dao-Guo Yang, G. Q. Zhang, H. J. L. Bressers
2007 J jnl
Numerical modeling of warpage induced in QFN array molding process.
Microelectron. Reliab.
Dao-Guo Yang, Kaspar M. B. Jansen, Leo J. Ernst, G. Q. Zhang, W. D. van Driel, H. J. L. Bressers, J. H. J. Janssen
2006 J jnl
Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions.
Microelectron. Reliab.
Cadmus A. Yuan, Willem D. van Driel, Richard B. R. van Silfhout, Olaf van der Sluis, Roy A. B. Engelen, Leo J. Ernst, Fred van Keulen, G. Q. Zhang
2004 J jnl
Parametric study on flip chip package with lead-free solder joints by using the probabilistic designing approach.
Microelectron. Reliab.
Dao-Guo Yang, J. S. Liang, Quan-Yong Li, Leo J. Ernst, G. Q. Zhang
2004 J jnl
Prediction of crack growth in IC passivation layers.
Microelectron. Reliab.
Y. T. He, Marcel A. J. van Gils, Willem D. van Driel, G. Q. Zhang, Richard B. R. van Silfhout, Leo J. Ernst
2004 J jnl
Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods.
Microelectron. Reliab.
Willem D. van Driel, C. J. Liu, G. Q. Zhang, J. H. J. Janssen, Richard B. R. van Silfhout, Marcel A. J. van Gils, Leo J. Ernst
2004 J jnl
Prediction of thermo-mechanical integrity of wafer backend processes.
Microelectron. Reliab.
Viktor Gonda, Jaap M. J. den Toonder, Johan Beijer, G. Q. Zhang, Willem D. van Driel, Romano J. O. M. Hoofman, Leo J. Ernst
2003 J jnl
Prediction and verification of process induced warpage of electronic packages.
Microelectron. Reliab.
W. D. van Driel, G. Q. Zhang, J. H. J. Janssen, Leo J. Ernst, Fei Su, Kerm Sin Chian, Sung Yi