Lei Li

13 papers A 3C 1Misc 2Journal 5Unranked 2
YearRankTypeTitle / Venue / Authors
2007 J jnl
Scan-BIST based on cluster analysis and the encoding of repeating sequences.
ACM Trans. Design Autom. Electr. Syst.
Lei Li, Zhanglei Wang, Krishnendu Chakrabarty
2006 J jnl
Analysis of Software Aging in a Web Server.
IEEE Trans. Reliab.
Michael Grottke, Lei Li, Kalyanaraman Vaidyanathan, Kishor S. Trivedi
2005 Misc conf
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores.
VLSI Design
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan
2005 A conf
Hybrid BIST Based on Repeating Sequences and Cluster Analysis.
DATE
Lei Li, Krishnendu Chakrabarty
2005 — conf
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation.
ASP-DAC
Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty
2004 J jnl
On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression.
J. Electron. Test.
Lei Li, Krishnendu Chakrabarty
2004 J jnl
Test set embedding for deterministic BIST using a reconfigurable interconnection network.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Lei Li, Krishnendu Chakrabarty
2003 A conf
Deterministic BIST Based on a Reconfigurable Interconnection Network.
ITC
Lei Li, Krishnendu Chakrabarty
2003 C conf
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume.
ICCD
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty
2003 Misc conf
Test Data Compression Using Dictionaries with Fixed-Length Indices.
VTS
Lei Li, Krishnendu Chakrabarty
2003 J jnl
Test data compression using dictionaries with selective entries and fixed-length indices.
ACM Trans. Design Autom. Electr. Syst.
Lei Li, Krishnendu Chakrabarty, Nur A. Touba
2002 — conf
An Approach for Estimation of Software Aging in a Web Server.
ISESE
Lei Li, Kalyanaraman Vaidyanathan, Kishor S. Trivedi
2002 A conf
Reliability and Availability Analysis for the JPL Remote Exploration and Experimentation System.
DSN
Dong Chen, Selvamuthu Dharmaraja, Dongyan Chen, Lei Li, Kishor S. Trivedi, Raphael R. Some, Allen P. Nikora