Lee Whetsel - RankMe

24 papers A 21C 1Misc 1Journal 1

Year	Rank	Type	Title / Venue / Authors
2010	A	`conf`	Commanded Test Access Port operations. ITC Lee Whetsel
2006	A	`conf`	A High Speed Reduced Pin Count JTAG Interface. ITC Lee Whetsel
2003	A	`conf`	Adapting JTAG for AC Interconnect Testing. ITC Lee Whetsel
2003	A	`conf`	Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. ITC Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel
2003	A	`conf`	Overview of the IEEE P1500 Standard. ITC Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
2002	A	`conf`	Inevitable Use of TAP Domains in SOCs. ITC Lee Whetsel
2001	A	`conf`	An analysis of power reduction techniques in scan testing. ITC Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
2000	A	`conf`	Adapting scan architectures for low power operation. ITC Lee Whetsel
1999	A	`conf`	Addressable test ports an approach to testing embedded cores. ITC Lee Whetsel
1999	A	`conf`	Towards a standard for embedded core test: an example. ITC Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel
1998	A	`conf`	Core test connectivity, communication, and control. ITC Lee Whetsel
1997	J	`jnl`	A silicon El Niño? IEEE Des. Test Comput. Lee Whetsel
1997	A	`conf`	An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. ITC Lee Whetsel
1997	A	`conf`	Test Access of TAP'ed & Non-TAP'ed Cores. ITC Lee Whetsel
1996	A	`conf`	Proposal to Simplify Development of a Mixed-Signal Test Standard. ITC Lee Whetsel
1995	A	`conf`	Improved Boundary Scan Design. ITC Lee Whetsel
1994	A	`conf`	An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. ITC Lee Whetsel
1994	A	`conf`	Navigating Test Access in Systems. ITC Lee Whetsel
1993	Misc	`conf`	An IEEE 1149.1 based voltmeter/oscilloscope in a chip. VTS Lee Whetsel
1993	A	`conf`	Hierarchically Accessing 1149.1 Applications in a System Environment. ITC Lee Whetsel
1992	A	`conf`	A Proposed Method of Accessing 1149.1 in a Backplane Environment. ITC Lee Whetsel
1991	A	`conf`	An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. ITC Lee Whetsel
1990	A	`conf`	Event qualification: a gateway to at-speed system testing. ITC Lee Whetsel
1988	C	`conf`	A proposed standard test bus and boundary scan architecture. ICCD Lee Whetsel