Laurent Latorre

55 papers A 5B 6C 8Misc 2Journal 15Unranked 19

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Digital-Based Solution for the Generation of FM/PM Test Stimuli. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Kamilia Tahraoui, Thibault Vayssade, François Lefevre, Laurent Latorre, Florence Azaïs
2024	—	`conf`	Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation Scheme. DFT Kamilia Tahraoui, R. Burelle, T. Vayssade, François Lefevre, Laurent Latorre, Florence Azaïs
2024	—	`conf`	Digital generation of single tone FM/PM test stimuli: a theoretical analysis. LATS Kamilia Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs
2024	—	`conf`	Low-cost generation of RF test stimuli from baseband digital signals. ATS Kamilia Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs
2023	—	`conf`	Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". LATS Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
2022	J	`jnl`	Addressing Power Issues in Biologging: An Audio/Inertial Recorder Case Study. Sensors Jonathan Miquel, Laurent Latorre, Simon Chamaillé-Jammes
2021	A	`conf`	Digital test of ZigBee transmitters: Validation in industrial test environment. DATE Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
2021	B	`conf`	Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. ETS Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre
2021	J	`jnl`	Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre
2020	C	`conf`	Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel
2020	—	`conf`	EVM measurement of RF ZigBee transceivers using standard digital ATE. DFT T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre
2019	B	`conf`	Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. ETS T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
2018	C	`conf`	Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. IOLTS T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
2017	C	`conf`	Combo of innovative educational approaches to teach industrial test to undergraduate students. EDUCON Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
2016	J	`jnl`	Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2016	C	`conf`	Industrial test project oriented education. EDUCON Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
2016	—	`conf`	Per peers learning educational approach to teach industrial test to undergraduate students. EWME Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
2016	—	`conf`	Problem-Based Learning Approach to Teach Printed Circuit Boards Test. ICL (1) Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
2016	J	`jnl`	SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. J. Electron. Test. Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015	—	`conf`	A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015	B	`conf`	A new technique for low-cost phase noise production testing from 1-bit signal acquisition. ETS Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2015	C	`conf`	Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. DDECS Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015	J	`jnl`	Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. J. Electron. Test. Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2014	A	`conf`	Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2014	—	`conf`	Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2012	A	`conf`	An efficient control variates method for yield estimation of analog circuits based on a local model. ICCAD Pierre-Francois Desrumaux, Yoan Dupret, Jens Tingleff, Sean Minehane, Mark Redford, Laurent Latorre, Pascal Nouet
2012	—	`conf`	Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE). NEWCAS Florence Azaïs, Laurent Latorre
2012	—	`conf`	Study of a high-resolution and low-power CMOS temperature sensor. NEWCAS Souha Hacine, Frédérick Mailly, Laurent Latorre, Pascal Nouet
2011	J	`jnl`	A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electron. Test. Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
2010	C	`conf`	A low power interface circuit for resistive sensors with digital offset compensation. ISCAS El Mehdi Boujamaa, Boris Alandry, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal Nouet
2010	—	`conf`	Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
2010	B	`conf`	On the use of standard digital ATE for the analysis of RF signals. ETS Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir
2009	—	`conf`	Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir
2009	J	`jnl`	Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering. Int. J. Online Eng. Laurent Latorre, Beatrice Pradarelli, Pascal Nouet
2009	J	`jnl`	Remote Labs for Industrial IC Testing. IEEE Trans. Learn. Technol. Beatrice Pradarelli, Laurent Latorre, Marie-Lise Flottes, Yves Bertrand, Pascal Nouet
2008	—	`conf`	A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers. BMAS Jean-Marc Gallière, Philippe Papet, Laurent Latorre
2008	—	`conf`	A CMOS Multi-sensor System for 3D Orientation Determination. ISVLSI Boris Alandry, Norbert Dumas, Laurent Latorre, Frédérick Mailly, Pascal Nouet
2008	—	`conf`	A Closed-Loop Architecture with Digital Output for Convective Accelerometers. ISVLSI Olivier Leman, Laurent Latorre, Frédérick Mailly, Pascal Nouet
2008	J	`jnl`	Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS CoRR El Mehdi Boujamaa, Yannick Soulie, Frédérick Mailly, Laurent Latorre, Pascal Nouet
2008	J	`jnl`	Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers CoRR Olivier Leman, Frédérick Mailly, Laurent Latorre, Pascal Nouet
2006	J	`jnl`	Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electron. Test. Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
2005	Misc	`conf`	On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
2005	—	`conf`	Test Engineering Education in Europe - The CRTC experience through the EuNICE-Test project. EDUTECH Laurent Latorre, Yves Bertrand, Michel Robert, Marie-Lise Flottes
2005	B	`conf`	Towards on-line testing of MEMS using electro-thermal excitation. ETS Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet
2004	J	`jnl`	Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Laurent Latorre, Vincent Beroulle, Pascal Nouet
2004	B	`conf`	Electrically-induced thermal stimuli for MEMS testing. ETS Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet
2002	—	`conf`	European Network for Test Education. DELTA Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival
2002	Misc	`conf`	Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
2002	A	`conf`	On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
2002	J	`jnl`	Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectron. Reliab. M. Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet, Guy Perez, Jean Marc Nicot, Coumar Oudéa
2002	—	`conf`	Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. LATW Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
2001	C	`conf`	Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC Vincent Beroulle, Laurent Latorre, M. Dardalhon, Coumar Oudéa, Guy Perez, Francis Pressecq, Pascal Nouet
2001	C	`conf`	Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
2001	J	`jnl`	Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electron. Test. Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
1999	A	`conf`	Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. DATE Laurent Latorre, Yves Bertrand, P. Hazard, Francis Pressecq, Pascal Nouet