Laurent Dupont

11 papers C 1Journal 10
YearRankTypeTitle / Venue / Authors
2014 J jnl
Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions.
Microelectron. Reliab.
Son-Ha Tran, Laurent Dupont, Zoubir Khatir
2013 C conf
Junction temperature measurements via thermo-sensitive electrical parameters and their application to condition monitoring and active thermal control of power converters.
IECON
Nick Baker, Marco Liserre, Laurent Dupont, Yvan Avenas
2012 J jnl
Evaluation of IGBT thermo-sensitive electrical parameters under different dissipation conditions - Comparison with infrared measurements.
Microelectron. Reliab.
Yvan Avenas, Laurent Dupont
2011 J jnl
Investigation of the heel crack mechanism in Al connections for power electronics modules.
Microelectron. Reliab.
Y. Celnikier, Lahouari Benabou, Laurent Dupont, Gerard Coquery
2011 J jnl
Optimization of wire connections design for power electronics.
Microelectron. Reliab.
Y. Celnikier, Laurent Dupont, E. Hervé, Gerard Coquery, Lahouari Benabou
2010 J jnl
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode.
Microelectron. Reliab.
Laurent Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau
2010 J jnl
Investigations on junction temperature estimation based on junction voltage measurements.
Microelectron. Reliab.
Zoubir Khatir, Laurent Dupont, Ali Ibrahim
2009 J jnl
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application.
Microelectron. Reliab.
Laurent Dupont, Gerard Coquery, K. Kriegel, A. Melkonyan
2007 J jnl
Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions.
Microelectron. Reliab.
M. Bouarroudj, Zoubir Khatir, Jean-Pierre Ousten, F. Badel, Laurent Dupont, Stéphane Lefebvre
2007 J jnl
Failure modes on low voltage power MOSFETs under high temperature application.
Microelectron. Reliab.
Laurent Dupont, Stéphane Lefebvre, M. Bouaroudj, Zoubir Khatir, Jean-Claude Faugières
2006 J jnl
Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling.
Microelectron. Reliab.
Laurent Dupont, Zoubir Khatir, Stéphane Lefebvre, S. Bontemps