Laurent Dupont

11 papers C 1Journal 10
YearRankTypeTitle / Venue / Authors
2014 J jnl
Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions.
Microelectron. Reliab.
Son-Ha Tran, Laurent Dupont, Zoubir Khatir
2013 C conf
Junction temperature measurements via thermo-sensitive electrical parameters and their application to condition monitoring and active thermal control of power converters.
IECON
Nick Baker, Marco Liserre, Laurent Dupont, Yvan Avenas
2012 J jnl
Evaluation of IGBT thermo-sensitive electrical parameters under different dissipation conditions - Comparison with infrared measurements.
Microelectron. Reliab.
Yvan Avenas, Laurent Dupont
2011 J jnl
Investigation of the heel crack mechanism in Al connections for power electronics modules.
Microelectron. Reliab.
Y. Celnikier, Lahouari Benabou, Laurent Dupont, Gerard Coquery
2011 J jnl
Optimization of wire connections design for power electronics.
Microelectron. Reliab.
Y. Celnikier, Laurent Dupont, E. Hervé, Gerard Coquery, Lahouari Benabou
2010 J jnl
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode.
Microelectron. Reliab.
Laurent Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau
2010 J jnl
Investigations on junction temperature estimation based on junction voltage measurements.
Microelectron. Reliab.
Zoubir Khatir, Laurent Dupont, Ali Ibrahim
2009 J jnl
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application.
Microelectron. Reliab.
Laurent Dupont, Gerard Coquery, K. Kriegel, A. Melkonyan
2007 J jnl
Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions.
Microelectron. Reliab.
M. Bouarroudj, Zoubir Khatir, Jean-Pierre Ousten, F. Badel, Laurent Dupont, Stéphane Lefebvre
2007 J jnl
Failure modes on low voltage power MOSFETs under high temperature application.
Microelectron. Reliab.
Laurent Dupont, Stéphane Lefebvre, M. Bouaroudj, Zoubir Khatir, Jean-Claude Faugières
2006 J jnl
Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling.
Microelectron. Reliab.
Laurent Dupont, Zoubir Khatir, Stéphane Lefebvre, S. Bontemps
2025 Best paper conf
Assessing the Effectiveness of the Tigress Obfuscator Against MOPSA and BinaryNinja.
CheckMATE
Nicolò Altamura, Enrico Bragastini, Marco Campion, Mila Dalla Preda
2026 Best paper preprint
ASSEMBLAGE-DEEPHISTORY: A Cross-Build Binary Dataset with Temporal Coverage.
arXiv
Chang Liu, Noah Fleischmann, Nicolò Altamura, Edward Raff, James Holt, Kristopher Micinski