Laurent Béchou

21 papers Journal 21
YearRankTypeTitle / Venue / Authors
2018 J jnl
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Microelectron. Reliab.
M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten
2017 J jnl
Practical optical gain by an extended Hakki-Paoli method.
Microelectron. Reliab.
Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou
2015 J jnl
Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes.
Microelectron. Reliab.
Pamela Del Vecchio, Arnaud Curutchet, Yannick Deshayes, M. Bettiati, F. Laruelle, Nathalie Labat, Laurent Béchou
2015 J jnl
Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment.
Microelectron. Reliab.
Jérémy Michaud, Guillaume Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby
2015 J jnl
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage.
Microelectron. Reliab.
Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou
2013 J jnl
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy.
Microelectron. Reliab.
A. Royon, K. Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, Yannick Deshayes
2013 J jnl
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing.
Microelectron. Reliab.
Ephraim Suhir, Laurent Béchou
2011 J jnl
An original DoE-based tool for silicon photodetectors EoL estimation in space environments.
Microelectron. Reliab.
Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi
2010 J jnl
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses.
Microelectron. Reliab.
Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten
2010 J jnl
Strain estimation in III-V materials by analysis of the degree of polarization of luminescence.
Microelectron. Reliab.
Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Béchou
2008 J jnl
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.
Microelectron. Reliab.
M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul
2008 J jnl
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.
Microelectron. Reliab.
Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten
2006 J jnl
Use of signal processing imaging for the study of a 3D package in harsh environment.
Microelectron. Reliab.
Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou
2005 J jnl
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectron. Reliab.
S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto
2004 J jnl
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.
Microelectron. Reliab.
Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé
2003 J jnl
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy.
IEEE Trans. Instrum. Meas.
Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano
2003 J jnl
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectron. Reliab.
Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
2003 J jnl
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectron. Reliab.
Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto
2003 J jnl
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectron. Reliab.
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
2002 J jnl
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).
Microelectron. Reliab.
Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto
2002 J jnl
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.
Microelectron. Reliab.
B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier