| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Multim. Tools Appl.
|
| 2024 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | J | jnl |
IEEE Trans. Educ.
|
| 2023 | J | jnl |
Int. J. Syst. Assur. Eng. Manag.
|
| 2023 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | J | jnl |
IEEE Trans. Reliab.
|
| 2022 | J | jnl |
IEEE Trans. Reliab.
|
| 2022 | J | jnl |
J. Supercomput.
|
| 2022 | J | jnl |
Inf. Softw. Technol.
|
| 2021 | J | jnl |
IEEE Trans. Educ.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Reliab.
|
| 2021 | J | jnl |
IEEE Trans. Educ.
|
| 2021 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2020 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2019 | C | conf |
HIS
|
| 2018 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2018 | J | jnl |
IET Softw.
|
| 2018 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | J | jnl |
IEEE Softw.
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2016 | J | jnl |
Computer
|
| 2015 | J | jnl |
IET Softw.
|
| 2014 | J | jnl |
ACM SIGSOFT Softw. Eng. Notes
|
| 2013 | J | jnl |
ACM SIGSOFT Softw. Eng. Notes
|
| 2012 | — | conf |
ISSRE Workshops
|
| 2011 | J | jnl |
J. Softw. Eng. Appl.
|
| 2011 | J | jnl |
J. Softw. Eng. Appl.
|