Kyungmee O. Kim

13 papers Journal 13
YearRankTypeTitle / Venue / Authors
2023 J jnl
Reliability maximization of a load-sharing system without redundant components.
Qual. Reliab. Eng. Int.
Kyungmee O. Kim, Seongjun Park, Yujin Hong
2018 J jnl
General model for the risk priority number in failure mode and effects analysis.
Reliab. Eng. Syst. Saf.
Kyungmee O. Kim, Ming Jian Zuo
2018 J jnl
Optimal allocation of reliability improvement target based on the failure risk and improvement cost.
Reliab. Eng. Syst. Saf.
Kyungmee O. Kim, Ming Jian Zuo
2016 J jnl
Derating design for optimizing reliability and cost with an application to liquid rocket engines.
Reliab. Eng. Syst. Saf.
Kyungmee O. Kim, Taeseong Roh, Jae-Woo Lee, Ming Jian Zuo
2013 J jnl
A new reliability allocation weight for reducing the occurrence of severe failure effects.
Reliab. Eng. Syst. Saf.
Kyungmee O. Kim, Yoonjung Yang, Ming Jian Zuo
2012 J jnl
Extending the Scope of Empirical Mode Decomposition by Smoothing.
EURASIP J. Adv. Signal Process.
Donghoh Kim, Kyungmee O. Kim, Hee-Seok Oh
2011 J jnl
Burn-in considering yield loss and reliability gain for integrated circuits.
Eur. J. Oper. Res.
Kyungmee O. Kim
2009 J jnl
Optimal burn-in for maximizing reliability of repairable non-series systems.
Eur. J. Oper. Res.
Kyungmee O. Kim, Way Kuo
2008 J jnl
Reliability functions estimated from commonly used yield models.
Microelectron. Reliab.
Kyungmee O. Kim, Hee-Seok Oh
2007 J jnl
Two fault classification methods for large systems when available data are limited.
Reliab. Eng. Syst. Saf.
Kyungmee O. Kim, Ming Jian Zuo
2006 J jnl
Relating integrated circuit yield and time-dependent reliability for various defect density distributions.
IEEE Trans. Reliab.
Kyungmee O. Kim
2005 J jnl
Some considerations on system burn-in.
IEEE Trans. Reliab.
Kyungmee O. Kim, W. Kuo
2004 J jnl
A relation model of gate oxide yield and reliability.
Microelectron. Reliab.
Kyungmee O. Kim, Way Kuo, Wen Luo