| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ASP-DAC
|
| 2025 | C | conf |
ISCAS
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
ISLPED
|
| 2025 | J | jnl |
CoRR
|
| 2025 | C | conf |
ISCAS
|
| 2025 | A | conf |
DATE
|
| 2024 | J | jnl |
CoRR
|
| 2024 | A* | conf |
DAC
|
| 2024 | A | conf |
ICCAD
|
| 2024 | J | jnl |
CoRR
|
| 2023 | — | conf |
ESSCIRC
|
| 2023 | — | conf |
AICAS
|
| 2023 | — | conf |
BioCAS
|
| 2020 | J | jnl |
Medical Image Anal.
|
| 2019 | A | conf |
DATE
|
| 2019 | A* | conf |
ICRA
|
| 2019 | J | jnl |
CoRR
|
| 2018 | — | conf |
MICCAI (2)
|
| 2018 | A* | conf |
ICRA
|
| 2018 | A | conf |
ITC
|
| 2018 | J | jnl |
Multim. Tools Appl.
|
| 2018 | A | conf |
IROS
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | J | jnl |
Medical Image Anal.
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | — | conf |
MICCAI (3)
|
| 2017 | A | conf |
IROS
|
| 2016 | A | conf |
WACV
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | — | conf |
MMM (1)
|
| 2016 | J | jnl |
Medical Image Anal.
|
| 2015 | — | conf |
MICCAI (1)
|
| 2015 | J | jnl |
Found. Trends Electron. Des. Autom.
|
| 2015 | A | conf |
ICCAD
|
| 2015 | A* | conf |
ISMAR
|
| 2015 | A | conf |
ITC
|
| 2015 | A* | conf |
ACM Multimedia
|
| 2014 | — | conf |
ACCV (3)
|
| 2014 | B | conf |
ICPR
|
| 2014 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2014 | A* | conf |
ACM Multimedia
|
| 2013 | A | conf |
DATE
|
| 2012 | — | conf |
ISPD
|
| 2012 | A* | conf |
ACM Multimedia
|
| 2012 | A | conf |
ITC
|
| 2012 | — | conf |
SiPS
|
| 2011 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | — | conf |
HLDVT
|
| 2011 | A* | conf |
DAC
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2011 | — | conf |
ASP-DAC
|
| 2011 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2010 | A* | conf |
DAC
|
| 2010 | J | jnl |
J. Electron. Test.
|
| 2010 | — | conf |
ECCV Workshops (1)
|
| 2010 | J | jnl |
Inf. Media Technol.
|
| 2010 | J | jnl |
IPSJ Trans. Syst. LSI Des. Methodol.
|
| 2010 | A* | conf |
DAC
|
| 2008 | Misc | conf |
VTS
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | — | ch. |
Wiley Encyclopedia of Computer Science and Engineering
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2008 | — | conf |
ATS
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | A | conf |
DATE
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | J | jnl |
IEEE Des. Test Comput.
|
| 2005 | — | ch. |
Embedded Systems Handbook
|
| 2005 | — | conf |
HLDVT
|
| 2004 | J | jnl |
J. Univers. Comput. Sci.
|
| 2004 | A | conf |
ITC
|
| 2004 | J | jnl |
IEEE Des. Test Comput.
|
| 2003 | — | ch. |
Web Document Analysis
|
| 2003 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2003 | — | conf |
ASP-DAC
|
| 2003 | J | jnl |
Des. Autom. Embed. Syst.
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | Misc | conf |
VTS
|
| 2001 | Misc | conf |
VTS
|
| 2001 | — | conf |
SIGMOD Conference
|
| 2000 | Misc | conf |
VTS
|
| 2000 | J | jnl |
IEEE Des. Test Comput.
|
| 1999 | Misc | conf |
VTS
|
| 1995 | J | jnl |
IEEE Des. Test Comput.
|
| 1995 | J | jnl |
IEEE Des. Test Comput.
|
| 1993 | J | jnl |
IEEE Des. Test Comput.
|