Kwame Osei Boateng

17 papers Misc 3Journal 8Unranked 6
YearRankTypeTitle / Venue / Authors
2026 J jnl
A Systematic Review of Machine Learning and Deep Learning Techniques for DDoS Attack Mitigation in IoT and Edge Computing Systems.
Secur. Priv.
Emmanuel Osei Owusu, Iddrisu Danlard, Gideon Opoku, Albert Dede, Griffith Selorm Klogo, Kwame Osei Boateng, Emmanuel Kofi Akowuah
2026 J jnl
Federated Learning Framework for Efficient and Secure Anomaly Detection in Industrial Control Systems.
J. Comput. Networks Commun.
Emmanuel Osei Owusu, Iddrisu Danlard, Griffith Selorm Klogo, Kwame Osei Boateng, Emmanuel Kofi Akowuah
2025 J jnl
DDOSNAS: Efficient Neural Architecture Search With Weight Sharing for Ddos Attack Detection.
Concurr. Comput. Pract. Exp.
Emmanuel Osei Owusu, Iddrisu Danlard, Griffith Selorm Klogo, Kwame Osei Boateng, Emmanuel Kofi Akowuah
2020 J jnl
PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networks.
Peer-to-Peer Netw. Appl.
Henry Nunoo-Mensah, Kwame Osei Boateng, James Dzisi Gadze
2018 J jnl
The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A survey.
Int. J. Commun. Syst.
Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze
2017 J jnl
Tamper-aware authentication framework for wireless sensor networks.
IET Wirel. Sens. Syst.
Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze
2015 — conf
A Retrofit Design Science Methodology for Smart Metering Design in Developing Countries.
ICCSA (Short Papers/poster papers/PhD student showcase works)
Julius Quarshie Azasoo, Kwame Osei Boateng
2013 J jnl
Small-Scale Fading Characteristics in Cellular Networks in Ghana.
Int. J. Interdiscip. Telecommun. Netw.
K. A. Bonsu, Kwame Osei Boateng, J. K. Oppong, Koffi A. Dotche
2003 Misc conf
BIST-Aided Scan Test - A New Method for Test Cost Reduction.
VTS
Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama
2002 J jnl
On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu
2001 — conf
A Method of Static Compaction of Test Stimuli.
Asian Test Symposium
Kwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata
2000 Misc conf
General BIST-Amenable Method of Test Generation for Iterative Logic Arrays.
VTS
Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu
1999 Misc conf
A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations.
VTS
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu
1999 — conf
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators.
Asian Test Symposium
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida
1998 — conf
Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation.
Asian Test Symposium
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu
1997 — conf
A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits.
Asian Test Symposium
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga
1997 — conf
Design of C-Testable Multipliers Based on the Modified Booth Algorithm.
Asian Test Symposium
Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu