Kunhyuk Kang

23 papers A* 4A 7C 1Journal 9Unranked 2
YearRankTypeTitle / Venue / Authors
2025 A* conf
Late Breaking Results: Utilization of Hybrid Threshold-Voltage Flip-flops for Power Recovery.
DAC
Sehyeon Chung, Hyun-chul Hwang, Byung Su Kim, Jaeha Lee, Kunhyuk Kang, Taewhan Kim
2010 J jnl
Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling.
IET Circuits Devices Syst.
Ik Joon Chang, Jongsun Park, Kunhyuk Kang, Kaushik Roy
2010 J jnl
On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures.
IEEE Trans. Very Large Scale Integr. Syst.
Kunhyuk Kang, Sang Phill Park, Keejong Kim, Kaushik Roy
2010 J jnl
Timed Input Pattern Generation for an Accurate Delay Calculation Under Multiple Input Switching.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Seung Hoon Choi, Kunhyuk Kang, Florentin Dartu, Kaushik Roy
2009 J jnl
Reliability Implications of Bias-Temperature Instability in Digital ICs.
IEEE Des. Test Comput.
Sang Phill Park, Kunhyuk Kang, Kaushik Roy
2009 J jnl
Variation Estimation and Compensation Technique in Scaled LTPS TFT Circuits for Low-Power Low-Cost Applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jing Li, Kunhyuk Kang, Kaushik Roy
2008 — conf
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?
ASP-DAC
Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy
2007 A* conf
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement.
DAC
Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy
2007 A conf
Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ.
ITC
Kunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy
2007 J jnl
Device-Aware Yield-Centric Dual-V
IEEE Trans. Very Large Scale Integr. Syst.
Amit Agarwal, Kunhyuk Kang, Swarup Bhunia, James D. Gallagher, Kaushik Roy
2007 A conf
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance.
ICCAD
Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam
2007 A* conf
High Performance and Low Power Electronics on Flexible Substrate.
DAC
Jing Li, Kunhyuk Kang, Aditya Bansal, Kaushik Roy
2007 J jnl
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Kunhyuk Kang, Haldun Kufluoglu, Kaushik Roy, Muhammad Ashraful Alam
2007 J jnl
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
2007 A* conf
Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop.
DAC
Kunhyuk Kang, Keejong Kim, Kaushik Roy
2006 C conf
Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI.
ICCD
Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
2006 J jnl
Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters.
ACM Trans. Design Autom. Electr. Syst.
Kunhyuk Kang, Bipul C. Paul, Kaushik Roy
2006 A conf
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.
DATE
Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy
2005 A conf
Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations.
ICCAD
Amit Agarwal, Kunhyuk Kang, Kaushik Roy
2005 A conf
Effectiveness of low power dual-V
ISLPED
Amit Agarwal, Kunhyuk Kang, Swarup Bhunia, James D. Gallagher, Kaushik Roy
2005 — conf
Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling.
CICC
Ik Joon Chang, Kunhyuk Kang, Saibal Mukhopadhyay, Chris H. Kim, Kaushik Roy
2005 A conf
Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring.
ITC
Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy
2005 A conf
Statistical Timing Analysis using Levelized Covariance Propagation.
DATE
Kunhyuk Kang, Bipul Chandra Paul, Kaushik Roy