Kunal P. Ganeshpure

21 papers A 2C 4Misc 1Journal 8Unranked 6
YearRankTypeTitle / Venue / Authors
2014 J jnl
Performance-driven dynamic thermal management of MPSoC based on task rescheduling.
ACM Trans. Design Autom. Electr. Syst.
Kunal P. Ganeshpure, Sandip Kundu
2013 J jnl
Game theoretic approach for run-time task scheduling on an multi-processor system on chip.
IET Circuits Devices Syst.
Kunal P. Ganeshpure, Sandip Kundu
2013 — conf
On runtime task graph extraction in MPSoC.
ISVLSI
Kunal P. Ganeshpure, Sandip Kundu
2012 — conf
A DFT Methodology for Repairing Embedded Memories of Large MPSoCs.
ISVLSI
Kunal P. Ganeshpure, Sandip Kundu
2012 J jnl
A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays.
IEEE Trans. Computers
Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu
2012 J jnl
A Wavelet-Based Spatio-Temporal Heat Dissipation Model for Reordering of Program Phases to Produce Temperature Extremes in a Chip.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Sudarshan Srinivasan, Kunal P. Ganeshpure, Sandip Kundu
2012 — conf
Reducing Temperature Variation in 3D Integrated Circuits Using Heat Pipes.
ISVLSI
Kunal P. Ganeshpure, Sandip Kundu
2012 J jnl
Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays.
IEEE Trans. Very Large Scale Integr. Syst.
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2011 — conf
Maximizing hotspot temperature: Wavelet based modelling of heating and cooling profile of functional workloads.
ISQED
Sudarshan Srinivasan, Kunal P. Ganeshpure, Sandip Kundu
2011 C conf
Task model for on-chip communication infrastructure design for multicore systems.
ICCD
Bharath Phanibhushana, Kunal P. Ganeshpure, Sandip Kundu
2010 J jnl
On ATPG for Multiple Aggressor Crosstalk Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Kunal P. Ganeshpure, Sandip Kundu
2009 Misc conf
An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays.
VLSI Design
Kunal P. Ganeshpure, Sandip Kundu
2009 J jnl
An Improved Soft-Error Rate Measurement Technique.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2009 — conf
Reducing temperature variability by routing heat pipes.
ACM Great Lakes Symposium on VLSI
Kunal P. Ganeshpure, Ilia Polian, Sandip Kundu, Bernd Becker
2008 J jnl
On Composite Leakage Current Maximization.
J. Electron. Test.
Ashesh Rastogi, Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu
2007 C conf
A Study on Impact of Leakage Current on Dynamic Power.
ISCAS
Ashesh Rastogi, Kunal P. Ganeshpure, Sandip Kundu
2007 C conf
Accelerating Soft Error Rate Testing Through Pattern Selection.
IOLTS
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2007 A conf
Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults.
DATE
Kunal P. Ganeshpure, Sandip Kundu
2007 A conf
On ATPG for multiple aggressor crosstalk faults in presence of gate delays.
ITC
Kunal P. Ganeshpure, Sandip Kundu
2007 — conf
On Accelerating Soft-Error Detection by Targeted Pattern Generation.
ISQED
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
2006 C conf
A Pattern Generation Technique for Maximizing Power Supply Currents.
ICCD
Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu