| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2026 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2026 | — | conf |
ASP-DAC
|
| 2026 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2026 | — | conf |
ASP-DAC
|
| 2025 | C | conf |
BSN
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
VTS
|
| 2025 | A | conf |
DATE
|
| 2025 | Misc | conf |
VTS
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
J. Hardw. Syst. Secur.
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | J | jnl |
IEEE Internet Things J.
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | A | conf |
ISLPED
|
| 2025 | J | jnl |
CoRR
|
| 2025 | B | conf |
ETS
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
ITC
|
| 2025 | A | conf |
ITC
|
| 2025 | A | conf |
ITC
|
| 2025 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A* | conf |
DAC
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
ITC
|
| 2025 | — | conf |
COINS
|
| 2025 | J | jnl |
CoRR
|
| 2025 | C | conf |
ICCD
|
| 2025 | A | conf |
ITC
|
| 2025 | A | conf |
ITC
|
| 2025 | A | conf |
DATE
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2025 | A | conf |
ICCAD
|
| 2025 | — | conf |
COINS
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | A | conf |
DATE
|
| 2025 | A | conf |
ITC
|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | C | conf |
ICCD
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
VTS
|
| 2025 | A | conf |
ITC
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | C | conf |
ICCD
|
| 2025 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2025 | — | conf |
ASP-DAC
|
| 2024 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2024 | Misc | conf |
VLSID
|
| 2024 | — | conf |
SPACE
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | — | conf |
ATS
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2024 | A | conf |
ITC
|
| 2024 | B | conf |
ETS
|
| 2024 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2024 | A | conf |
ITC
|
| 2024 | — | conf |
ATS
|
| 2024 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2024 | — | conf |
ATS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | C | conf |
ICMLA
|
| 2024 | A | conf |
ICCAD
|
| 2024 | J | jnl |
IEEE Internet Things J.
|
| 2024 | — | conf |
MLCAD
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | C | conf |
BSN
|
| 2024 | J | jnl |
J. Parallel Distributed Comput.
|
| 2024 | A | conf |
DATE
|
| 2024 | — | conf |
ACNS Workshops (2)
|
| 2024 | C | conf |
ICMLA
|
| 2024 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2024 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2024 | A | conf |
ITC
|
| 2024 | J | jnl |
CoRR
|
| 2024 | A | conf |
ITC
|
| 2024 | B | conf |
ETS
|
| 2024 | Misc | conf |
VTS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | B | conf |
ASPDAC
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | A | conf |
ITC
|
| 2023 | J | jnl |
CoRR
|
| 2023 | B | conf |
ETS
|
| 2023 | A | conf |
DATE
|
| 2023 | — | conf |
BioCAS
|
| 2023 | A | conf |
ITC
|
| 2023 | J | jnl |
CoRR
|
| 2023 | — | conf |
ICDH
|
| 2023 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | — | conf |
ASP-DAC
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | A | conf |
DATE
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | A | conf |
ISLPED
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | Misc | conf |
VTS
|
| 2023 | J | jnl |
IEEE Internet Things J.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Des. Test
|
| 2023 | — | conf |
CCGridW
|
| 2023 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2023 | A | conf |
ITC
|
| 2023 | A | conf |
DATE
|
| 2023 | A | conf |
ITC
|
| 2023 | Misc | conf |
VTS
|
| 2023 | J | jnl |
IEEE Internet Things J.
|
| 2023 | B | conf |
ETS
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | — | conf |
COINS
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Internet Things J.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | A | conf |
DATE
|
| 2022 | A | conf |
ITC
|
| 2022 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | — | conf |
OFC
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
ACM Comput. Surv.
|
| 2022 | C | conf |
ICMLA
|
| 2022 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2022 | B | conf |
ETS
|
| 2022 | A | conf |
ICCAD
|
| 2022 | J | jnl |
CoRR
|
| 2022 | — | conf |
IPDPS Workshops
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | A | conf |
ITC
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | A | conf |
DATE
|
| 2022 | A | conf |
DATE
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | A | conf |
DATE
|
| 2022 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2022 | J | jnl |
CoRR
|
| 2022 | B | conf |
ETS
|
| 2022 | A | conf |
ICCAD
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | — | conf |
ISQED
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2022 | — | conf |
ISVLSI
|
| 2022 | — | conf |
ISVLSI
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | Misc | conf |
VTS
|
| 2022 | Misc | conf |
VTS
|
| 2022 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2022 | C | conf |
IOLTS
|
| 2022 | B | conf |
ETS
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | A | conf |
ITC
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | A | conf |
ITC
|
| 2021 | A | conf |
DATE
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A | conf |
ICCAD
|
| 2021 | A | conf |
ITC
|
| 2021 | A | conf |
DATE
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2021 | A | conf |
DATE
|
| 2021 | A | conf |
DATE
|
| 2021 | A | conf |
ICCAD
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2021 | A | conf |
DATE
|
| 2021 | A | conf |
ICCAD
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A | conf |
ITC
|
| 2021 | — | conf |
OFC
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A | conf |
ICCAD
|
| 2021 | A* | conf |
ICML
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | A | conf |
DATE
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A* | conf |
DAC
|
| 2021 | A | conf |
DATE
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
BioCAS
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | — | conf |
MLHC
|
| 2021 | — | conf |
ITC-Asia
|
| 2021 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | Misc | conf |
VTS
|
| 2021 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2020 | A* | conf |
ICML
|
| 2020 | J | jnl |
IEEE Des. Test
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | A | conf |
ITC
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Big Data
|
| 2020 | — | conf |
ATS
|
| 2020 | A | conf |
DATE
|
| 2020 | B | conf |
ETS
|
| 2020 | — | conf |
ATS
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | A | conf |
ITC
|
| 2020 | B | conf |
Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model.
ETS
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2020 | — | conf |
VLSI-DAT
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | Misc | conf |
VTS
|
| 2020 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | — | conf |
ATS
|
| 2020 | A | conf |
ITC
|
| 2020 | — | conf |
ATS
|
| 2020 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2020 | A | conf |
ICCAD
|
| 2020 | — | conf |
ASP-DAC
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | A | conf |
ITC
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2019 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2019 | A | conf |
DATE
|
| 2019 | Misc | conf |
VTS
|
| 2019 | Misc | conf |
VTS
|
| 2019 | B | conf |
ETS
|
| 2019 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2019 | C | conf |
IOLTS
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | A | conf |
DATE
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
Dagstuhl Reports
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | A | conf |
ITC
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | A | conf |
ITC
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | — | conf |
BioCAS
|
| 2019 | A | conf |
ITC
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2019 | A | conf |
ITC
|
| 2019 | B | conf |
ETS
|
| 2019 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2019 | A | conf |
DATE
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | A* | conf |
DAC
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | — | ed. |
COINS
|
| 2019 | A | conf |
ITC
|
| 2019 | A | conf |
DATE
|
| 2019 | A* | conf |
DAC
|
| 2019 | J | jnl |
IEEE Des. Test
|
| 2019 | Misc | conf |
VTS
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | Misc | conf |
VLSID
|
| 2019 | — | conf |
COINS
|
| 2019 | — | conf |
BioCAS
|
| 2019 | A | conf |
ITC
|
| 2019 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | A* | conf |
DAC
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | Misc | conf |
VTS
|
| 2019 | A | conf |
ICCAD
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2019 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | — | conf |
NOCS
|
| 2018 | A | conf |
ITC
|
| 2018 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2018 | B | conf |
ETS
|
| 2018 | Misc | conf |
VTS
|
| 2018 | A | conf |
ITC
|
| 2018 | Misc | conf |
VTS
|
| 2018 | A | conf |
ITC
|
| 2018 | J | jnl |
Proc. IEEE
|
| 2018 | Misc | conf |
VLSID
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | B | conf |
ETS
|
| 2018 | A* | conf |
DAC
|
| 2018 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | — | ch. |
Advanced Logic Synthesis
|
| 2018 | Misc | conf |
VLSID
|
| 2018 | A | conf |
ICCAD
|
| 2018 | A | conf |
ITC
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | A | conf |
DATE
|
| 2018 | A | conf |
ITC
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | B | conf |
ETS
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | C | conf |
DSD
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2018 | — | conf |
ICECS
|
| 2018 | A | conf |
DATE
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | Misc | conf |
VTS
|
| 2018 | A | conf |
ITC
|
| 2018 | A | conf |
ICCAD
|
| 2018 | Misc | conf |
VTS
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2018 | A* | conf |
DAC
|
| 2018 | — | conf |
ICICDT
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | C | conf |
ICCD
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | A | conf |
ICCAD
|
| 2017 | A | conf |
ITC
|
| 2017 | A | conf |
DATE
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | Misc | conf |
CODES+ISSS
|
| 2017 | A | conf |
ICCAD
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
Droplet Size-Aware High-Level Synthesis for Micro-Electrode-Dot-Array Digital Microfluidic Biochips.
IEEE Trans. Biomed. Circuits Syst.
|
| 2017 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | — | conf |
ASP-DAC
|
| 2017 | A* | conf |
DAC
|
| 2017 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2017 | J | jnl |
NII Shonan Meet. Rep.
|
| 2017 | C | conf |
ICCD
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | A | conf |
DATE
|
| 2017 | A | conf |
ITC
|
| 2017 | — | conf |
ISVLSI
|
| 2017 | — | conf |
ATS
|
| 2017 | C | conf |
ICCD
|
| 2017 | A | conf |
ITC
|
| 2017 | A | conf |
ICCAD
|
| 2017 | A | conf |
ITC
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2017 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | Misc | conf |
VTS
|
| 2017 | J | jnl |
CoRR
|
| 2017 | A | conf |
DATE
|
| 2017 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2017 | — | conf |
ASP-DAC
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | B | conf |
ETS
|
| 2016 | Misc | conf |
VTS
|
| 2016 | Misc | conf |
CASES
|
| 2016 | A | conf |
ITC
|
| 2016 | A | conf |
ITC
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | B | conf |
ETS
|
| 2016 | A | conf |
ITC
|
| 2016 | — | conf |
BioCAS
|
| 2016 | A | conf |
ITC
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
Computer
|
| 2016 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | A | conf |
ICCAD
|
| 2016 | A | conf |
ICCAD
|
| 2016 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | C | conf |
VLSI-SoC
|
| 2016 | A* | conf |
DAC
|
| 2016 | A | conf |
DATE
|
| 2016 | — | conf |
BioCAS
|
| 2016 | — | conf |
ATS
|
| 2016 | J | jnl |
Multicast-Based Testing and Thermal-Aware Test Scheduling for 3D ICs with a Stacked Network-on-Chip.
IEEE Trans. Computers
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | Misc | conf |
VTS
|
| 2016 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2016 | Misc | conf |
VTS
|
| 2016 | A | conf |
DATE
|
| 2016 | A | conf |
DATE
|
| 2016 | A | conf |
ITC
|
| 2016 | J | jnl |
IEEE ACM Trans. Comput. Biol. Bioinform.
|
| 2016 | J | jnl |
Computer
|
| 2016 | A | conf |
ITC
|
| 2016 | — | conf |
ATS
|
| 2016 | — | conf |
ATS
|
| 2016 | A | conf |
ITC
|
| 2016 | — | conf |
LATS
|
| 2016 | A | conf |
ICCAD
|
| 2016 | A | conf |
DATE
|
| 2016 | B | conf |
ETS
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | A | conf |
ICCAD
|
| 2015 | B | conf |
ETS
|
| 2015 | A | conf |
ITC
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | — | conf |
SyDe Summer School
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | A | conf |
DATE
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | A | conf |
ITC
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | C | conf |
ICCD
|
| 2015 | — | book |
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | A | conf |
ICCAD
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | — | conf |
ASP-DAC
|
| 2015 | J | jnl |
Dagstuhl Reports
|
| 2015 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Multi Scale Comput. Syst.
|
| 2015 | A | conf |
ITC
|
| 2015 | A | conf |
DATE
|
| 2015 | Misc | conf |
VTS
|
| 2015 | — | conf |
BioCAS
|
| 2015 | Misc | conf |
VTS
|
| 2015 | A | conf |
ICCAD
|
| 2015 | — | book |
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | A* | conf |
DAC
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | B | conf |
ETS
|
| 2015 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2015 | A | conf |
ICCAD
|
| 2015 | B | conf |
ETS
|
| 2015 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | C | conf |
ICCD
|
| 2015 | C | conf |
IOLTS
|
| 2015 | — | conf |
ASP-DAC
|
| 2015 | — | conf |
ASP-DAC
|
| 2015 | A | conf |
ITC
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | A | conf |
ITC
|
| 2015 | B | conf |
ETS
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
Integr.
|
| 2014 | A | conf |
ITC
|
| 2014 | — | conf |
ATS
|
| 2014 | J | jnl |
J. Low Power Electron.
|
| 2014 | Misc | conf |
VTS
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | C | conf |
ICCD
|
| 2014 | — | conf |
ISVLSI
|
| 2014 | — | ch. |
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | Misc | conf |
CASES
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2014 | A* | conf |
DAC
|
| 2014 | A | conf |
ICCAD
|
| 2014 | — | book |
|
| 2014 | J | jnl |
J. Electron. Test.
|
| 2014 | J | jnl |
IET Comput. Digit. Tech.
|
| 2014 | J | jnl |
IEEE Des. Test
|
| 2014 | A | conf |
ITC
|
| 2014 | A | conf |
ITC
|
| 2014 | A | conf |
DATE
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | Misc | conf |
VTS
|
| 2014 | J | jnl |
IEEE Trans. Computers
|
| 2014 | — | conf |
VLSI-DAT
|
| 2014 | B | conf |
ETS
|
| 2014 | — | conf |
DTIS
|
| 2014 | — | conf |
ATS
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2014 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2014 | J | jnl |
Inf. Media Technol.
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| 2014 | J | jnl |
IPSJ Trans. Syst. LSI Des. Methodol.
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| 2014 | Misc | conf |
VTS
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | Misc | conf |
VTS
|
| 2014 | — | book |
|
| 2014 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2014 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2014 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | — | conf |
ASP-DAC
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | A | conf |
ITC
|
| 2013 | J | jnl |
CoRR
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2013 | J | jnl |
J. Circuits Syst. Comput.
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| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | A* | conf |
DAC
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2013 | C | conf |
DDECS
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | — | conf |
3DIC
|
| 2013 | A | conf |
DATE
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | B | conf |
ETS
|
| 2013 | A | conf |
DATE
|
| 2013 | — | conf |
ISED
|
| 2013 | A* | conf |
DAC
|
| 2013 | — | conf |
VDAT
|
| 2013 | — | conf |
ISED
|
| 2013 | A | conf |
ICCAD
|
| 2013 | Misc | conf |
VTS
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | A | conf |
ITC
|
| 2013 | B | conf |
ETS
|
| 2013 | — | conf |
ISVLSI
|
| 2013 | — | conf |
Asian Test Symposium
|
| 2013 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2013 | Misc | conf |
VTS
|
| 2013 | A | conf |
DATE
|
| 2013 | Misc | conf |
VTS
|
| 2013 | C | conf |
VLSI-SoC
|
| 2013 | A | conf |
ITC
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | A | conf |
DATE
|
| 2012 | A | conf |
ITC
|
| 2012 | C | conf |
ISCAS
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | — | conf |
CASE
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | book |
|
| 2012 | C | conf |
ICCD
|
| 2012 | A* | conf |
DAC
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | B | conf |
ETS
|
| 2012 | A | conf |
ICCAD
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | — | conf |
ISED
|
| 2012 | — | conf |
ISVLSI
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | Misc | conf |
VTS
|
| 2012 | B | conf |
ETS
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | A | conf |
ITC
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | A* | conf |
DAC
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2012 | A | conf |
DATE
|
| 2012 | A | conf |
DATE
|
| 2012 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | B | conf |
ETS
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
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| 2011 | — | conf |
3DIC
|
| 2011 | C | conf |
IOLTS
|
| 2011 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | Misc | conf |
VLSI Design
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2011 | — | conf |
ISPD
|
| 2011 | B | conf |
ETS
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | — | conf |
SoCC
|
| 2011 | — | conf |
ASP-DAC
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| 2011 | Misc | conf |
CODES+ISSS
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| 2011 | Misc | conf |
CODES+ISSS
|
| 2011 | J | jnl |
J. Electron. Test.
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| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | J | jnl |
J. Electron. Test.
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| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | Misc | conf |
VLSI Design
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2011 | J | jnl |
IEEE J. Sel. Areas Commun.
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| 2011 | A | conf |
ITC
|
| 2011 | — | conf |
3DIC
|
| 2011 | B | conf |
ETS
|
| 2011 | A | conf |
ICCAD
|
| 2011 | B | conf |
ETS
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| 2011 | A | conf |
ITC
|
| 2011 | — | book |
Test Infrastructure Design - for Digital, Mixed-Signal and Hierarchical SOCs.
|
| 2011 | J | jnl |
J. Electron. Test.
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | — | book |
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2011 | J | jnl |
IET Comput. Digit. Tech.
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | C | conf |
DDECS
|
| 2011 | — | conf |
Asian Test Symposium
|
| 2011 | A | conf |
ICCAD
|
| 2011 | A | conf |
DATE
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | Misc | conf |
VTS
|
| 2010 | J | jnl |
Int. J. Distributed Sens. Networks
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| 2010 | Misc | conf |
VTS
|
| 2010 | A | conf |
ITC
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | A | conf |
ICCAD
|
| 2010 | J | jnl |
Int. J. Distributed Sens. Networks
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| 2010 | — | conf |
Asian Test Symposium
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| 2010 | A | conf |
DATE
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2010 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
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| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | — | book |
|
| 2010 | — | conf |
ISVLSI
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| 2010 | — | conf |
ISVLSI (Selected papers)
|
| 2010 | Misc | conf |
VLSI Design
|
| 2010 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
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| 2010 | A | conf |
ICCAD
|
| 2010 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2010 | A | conf |
DATE
|
| 2010 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2010 | A | conf |
ICCAD
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | A | conf |
ITC
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2010 | Misc | conf |
VTS
|
| 2010 | A | conf |
ITC
|
| 2010 | J | jnl |
J. Electron. Test.
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| 2010 | A | conf |
DATE
|
| 2010 | Misc | conf |
VLSI Design
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| 2010 | A* | conf |
DAC
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| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2010 | J | jnl |
Microelectron. J.
|
| 2010 | B | conf |
ETS
|
| 2010 | — | conf |
Asian Test Symposium
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| 2010 | — | conf |
Asian Test Symposium
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| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
IET Comput. Digit. Tech.
|
| 2009 | A | conf |
DATE
|
| 2009 | Misc | conf |
VTS
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2009 | — | conf |
CSE (4)
|
| 2009 | — | conf |
ACM Great Lakes Symposium on VLSI
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| 2009 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
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| 2009 | A | conf |
DATE
|
| 2009 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
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| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2009 | A | conf |
ICCAD
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| 2009 | J | jnl |
Int. J. Parallel Program.
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| 2009 | A | conf |
ITC
|
| 2009 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2009 | Misc | conf |
VTS
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| 2009 | — | conf |
HLDVT
|
| 2009 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
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| 2009 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2009 | A | conf |
DATE
|
| 2009 | J | jnl |
IEEE Des. Test Comput.
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| 2009 | — | conf |
ASP-DAC
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2009 | C | conf |
ICCD
|
| 2009 | C | conf |
ICCD
|
| 2009 | J | jnl |
IEEE Trans. Computers
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| 2009 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2008 | J | jnl |
IEEE Des. Test Comput.
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| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2008 | J | jnl |
J. Electron. Test.
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| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2008 | — | conf |
ISPD
|
| 2008 | A* | conf |
DAC
|
| 2008 | A | conf |
ITC
|
| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2008 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
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| 2008 | A | conf |
ICCAD
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| 2008 | — | conf |
NanoNet
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| 2008 | A | conf |
ITC
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| 2008 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2008 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2008 | A | conf |
ITC
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| 2008 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2008 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2008 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
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| 2008 | C | conf |
IOLTS
|
| 2008 | — | conf |
ATS
|
| 2008 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2008 | A | conf |
ITC
|
| 2008 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
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| 2008 | A | conf |
DATE
|
| 2008 | A | conf |
ITC
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| 2008 | A | conf |
DATE
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| 2008 | Misc | conf |
VTS
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| 2008 | Misc | conf |
VTS
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| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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| 2008 | C | conf |
ICCD
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| 2008 | J | jnl |
IEICE Trans. Inf. Syst.
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| 2007 | B | conf |
ETS
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| 2007 | A | conf |
DATE
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| 2007 | — | conf |
ASP-DAC
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| 2007 | Misc | conf |
VLSI Design
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| 2007 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
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| 2007 | J | jnl |
J. Electron. Test.
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| 2007 | Misc | conf |
VLSI Design
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| 2007 | C | conf |
DDECS
|
| 2007 | J | jnl |
CoRR
|
| 2007 | — | book |
|
| 2007 | J | jnl |
IEEE Trans. Mob. Comput.
|
| 2007 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2007 | A | conf |
ITC
|
| 2007 | J | jnl |
IEEE Des. Test Comput.
|
| 2007 | A | conf |
DATE
|
| 2007 | A* | conf |
DAC
|
| 2007 | J | jnl |
IEEE Trans. Computers
|
| 2007 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2007 | B | conf |
ETS
|
| 2007 | C | conf |
MobiQuitous
|
| 2007 | J | jnl |
CoRR
|
| 2007 | J | jnl |
Int. J. Distributed Sens. Networks
|
| 2007 | A* | conf |
DAC
|
| 2007 | — | conf |
ATS
|
| 2007 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2007 | A | conf |
DATE
|
| 2007 | J | jnl |
CoRR
|
| 2007 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2007 | Misc | conf |
VLSI Design
|
| 2007 | A | conf |
ITC
|
| 2007 | J | jnl |
J. Electron. Test.
|
| 2007 | — | conf |
ATS
|
| 2007 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2007 | J | jnl |
CoRR
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | — | conf |
ATS
|
| 2006 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2006 | B | conf |
WCNC
|
| 2006 | C | conf |
ICCD
|
| 2006 | A* | conf |
DAC
|
| 2006 | — | conf |
ATS
|
| 2006 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2006 | A | conf |
ITC
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | A | conf |
ITC
|
| 2006 | A | conf |
DATE
|
| 2006 | Misc | conf |
CODES+ISSS
|
| 2006 | A | conf |
DATE
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2006 | — | conf |
ATS
|
| 2006 | — | conf |
DFT
|
| 2006 | J | jnl |
J. Electron. Test.
|
| 2006 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2006 | A | conf |
DATE
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2005 | J | jnl |
IEEE Trans. Computers
|
| 2005 | C | conf |
ICCD
|
| 2005 | A | conf |
ICCAD
|
| 2005 | — | ch. |
Handbook on Theoretical and Algorithmic Aspects of Sensor, Ad Hoc Wireless, and Peer-to-Peer Networks
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| 2005 | B | conf |
ETS
|
| 2005 | J | jnl |
IEEE Trans. Reliab.
|
| 2005 | Misc | conf |
VTS
|
| 2005 | A | conf |
ITC
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2005 | A | conf |
DATE
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | Misc | conf |
VLSI Design
|
| 2005 | B | conf |
DCOSS
|
| 2005 | A | conf |
DATE
|
| 2005 | — | conf |
Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling.
DFT
|
| 2005 | J | jnl |
IEEE Trans. Computers
|
| 2005 | — | ch. |
Embedded Systems Handbook
|
| 2005 | A* | conf |
DAC
|
| 2005 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2005 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2005 | A | conf |
DATE
|
| 2005 | — | book |
|
| 2005 | Misc | conf |
CODES+ISSS
|
| 2005 | A | conf |
DATE
|
| 2005 | — | conf |
ASP-DAC
|
| 2005 | A | conf |
ITC
|
| 2005 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2005 | A | conf |
ICCAD
|
| 2005 | A* | conf |
DAC
|
| 2005 | A | conf |
ITC
|
| 2005 | A | conf |
DATE
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | A | conf |
ICCAD
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2004 | — | conf |
ISVLSI
|
| 2004 | J | jnl |
IEEE Trans. Computers
|
| 2004 | A | conf |
ITC
|
| 2004 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2004 | A | conf |
DATE
|
| 2004 | A* | conf |
DAC
|
| 2004 | A | conf |
ITC
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2004 | A | conf |
DATE
|
| 2004 | J | jnl |
IEEE Trans. Knowl. Data Eng.
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2004 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2004 | A | conf |
DATE
|
| 2004 | — | ch. |
Handbook of Sensor Networks
|
| 2004 | B | conf |
ETS
|
| 2004 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2004 | J | jnl |
J. Parallel Distributed Comput.
|
| 2003 | A | conf |
DATE
|
| 2003 | A | conf |
DATE
|
| 2003 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | — | ch. |
Embedded Software for SoC
|
| 2003 | — | conf |
ISQED
|
| 2003 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2003 | Misc | conf |
VTS
|
| 2003 | A | conf |
ITC
|
| 2003 | A | conf |
DATE
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | A | conf |
DATE
|
| 2003 | A | conf |
ICCAD
|
| 2003 | A* | conf |
PerCom
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | — | conf |
DFT
|
| 2003 | A | conf |
ICCAD
|
| 2003 | C | conf |
ICCD
|
| 2003 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2003 | A* | conf |
INFOCOM
|
| 2003 | B | conf |
WCNC
|
| 2003 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2003 | A | conf |
ICCAD
|
| 2003 | J | jnl |
Ad Hoc Networks
|
| 2003 | J | jnl |
IEEE Trans. Computers
|
| 2003 | Misc | conf |
VTS
|
| 2003 | J | jnl |
IEEE Trans. Computers
|
| 2003 | A* | conf |
DAC
|
| 2003 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2003 | A | conf |
ITC
|
| 2003 | B | conf |
GLOBECOM
|
| 2003 | — | conf |
ETW
|
| 2002 | A | conf |
ITC
|
| 2002 | A | conf |
DATE
|
| 2002 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | A | conf |
DATE
|
| 2002 | — | conf |
IEEE Real Time Technology and Applications Symposium
|
| 2002 | J | jnl |
IEEE Trans. Computers
|
| 2002 | J | jnl |
J. Electron. Test.
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| 2002 | J | jnl |
Int. J. High Perform. Comput. Appl.
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| 2002 | Misc | conf |
VTS
|
| 2002 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | Misc | conf |
VTS
|
| 2002 | — | conf |
CODES
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | A* | conf |
DAC
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | J | jnl |
IEEE Trans. Computers
|
| 2002 | A | conf |
ITC
|
| 2002 | A | conf |
DATE
|
| 2002 | — | book |
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2002 | A* | conf |
DAC
|
| 2001 | — | conf |
CICC
|
| 2001 | — | conf |
ITCC
|
| 2001 | A* | conf |
DAC
|
| 2001 | Misc | conf |
VTS
|
| 2001 | J | jnl |
J. Frankl. Inst.
|
| 2001 | — | conf |
CODES
|
| 2001 | J | jnl |
VLSI Design
|
| 2001 | A | conf |
DATE
|
| 2001 | Misc | conf |
VTS
|
| 2001 | — | conf |
ASP-DAC
|
| 2001 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2001 | Misc | conf |
VTS
|
| 2001 | J | jnl |
J. Frankl. Inst.
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | Misc | conf |
VLSI Design
|
| 2001 | — | conf |
ASP-DAC
|
| 2001 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2001 | J | jnl |
IEEE Des. Test Comput.
|
| 2001 | A | conf |
ITC
|
| 2000 | C | conf |
ISCAS
|
| 2000 | Misc | conf |
VTS
|
| 2000 | A* | conf |
DAC
|
| 2000 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2000 | Misc | conf |
PDPTA
|
| 2000 | Misc | conf |
VTS
|
| 2000 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2000 | Misc | conf |
VTS
|
| 2000 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2000 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 1999 | Misc | conf |
VTS
|
| 1999 | J | jnl |
J. Electron. Test.
|
| 1999 | J | jnl |
Inf. Process. Lett.
|
| 1999 | — | conf |
ISCAS (1)
|
| 1999 | A | conf |
ICCAD
|
| 1998 | Misc | conf |
VTS
|
| 1998 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1998 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 1998 | J | jnl |
IEEE Trans. Inf. Theory
|
| 1998 | J | jnl |
IEEE Trans. Computers
|
| 1998 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1998 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1997 | J | jnl |
Inf. Process. Lett.
|
| 1997 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1997 | A | conf |
ITC
|
| 1996 | J | jnl |
J. Electron. Test.
|
| 1996 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 1995 | A | conf |
ITC
|
| 1995 | — | — |
|
| 1994 | A* | conf |
DAC
|
| 1994 | A | conf |
ITC
|
| 1993 | Misc | conf |
VTS
|
| 1993 | — | conf |
FTCS
|