Krishna C. Saraswat

11 papers Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2024 — conf
Nanoscale MoS2 Transistors on Polyimide for Radio-Frequency Operation.
DRC
Eros Reato, P. Palacios, J. A. Yang, S. Wahid, Marc Jaikissoon, J.-S. Ko, Alwin Daus, M. Saeed, Krishna C. Saraswat, Renato Negra, Eric Pop, Max Christian Lemme
2023 — conf
Local Back-Gate Monolayer MoS2 Transistors with Channel Lengths Down to 50 nm and EOT ∼ 1 nm Showing Improved $I_{\text{on}}$ using Post-Metal Anneal.
DRC
Marc Jaikissoon, Jung-Soo Ko, Eric Pop, Krishna C. Saraswat
2023 — conf
Ultrathin Gate Dielectric Enabled by Nanofog Aluminum Oxide on Monolayer MoS2.
ESSDERC
Jung-Soo Ko, Zichen Zhang, Sol Lee, Marc Jaikissoon, Robert K. A. Bennett, Kwanpyo Kim, Andrew C. Kummel, Prabhakar Bandaru, Eric Pop, Krishna C. Saraswat
2022 — conf
Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties.
DRC
Lauren Hoang, Alwin Daus, Sumaiya Wahid, Jimin Kwon, Jung-Soo Ko, Shengjun Qin, Mahnaz Islam, Krishna C. Saraswat, H.-S. Philip Wong, Eric Pop
2022 — conf
First Demonstration of Top-Gated ITO Transistors: Effect of Channel Passivation.
DRC
Sumaiya Wahid, Alwin Daus, Jimin Kwon, Shengjun Qin, Jung-Soo Ko, Krishna C. Saraswat, H.-S. Philip Wong, Eric Pop
2022 — conf
Mobility Enhancement of Monolayer MoS2 Transistors using Tensile-Stressed Silicon Nitride Capping Layers.
DRC
Marc Jaikissoon, Jerry A. Yang, Kathryn M. Neilson, Eric Pop, Krishna C. Saraswat
2019 — conf
3D-stacked Strained SiGe/Ge Gate-All-Around (GAA) Structure Fabricated by 3D Ge Condensation.
DRC
Junkyo Suh, Andrew C. Meng, Marc Jaikissoon, Michael Braun, Taeho R. Kim, Ann F. Marshall, Anahita Pakzad, Paul C. McIntyre, Krishna C. Saraswat
2001 J jnl
3-D ICs: a novel chip design for improving deep-submicrometer interconnect performance and systems-on-chip integration.
Proc. IEEE
Kaustav Banerjee, Shukri J. Souri, Pawan Kapur, Krishna C. Saraswat
2001 J jnl
Interconnect limits on gigascale integration (GSI) in the 21st century.
Proc. IEEE
Jeffery A. Davis, Raguraman Venkatesan, Alan Kaloyeros, Michael Beylansky, Shukri J. Souri, Kaustav Banerjee, Krishna C. Saraswat, Arifur Rahman, Rafael Reif, James D. Meindl
2001 J jnl
Reliability Studies on Multilevel Interconnection with Intermetal Dielectric Air Gaps.
Microelectron. Reliab.
Valeriy Sukharev, Ben P. Shieh, Ratan K. Choudhury, Chong W. Park, Krishna C. Saraswat
1991 J jnl
Merged BiCMOS logic to extend the CMOS/BiCMOS performance crossover below 2.5-V supply.
IEEE J. Solid State Circuits
Rosalyn B. Ritts, Prasad A. Raje, James D. Plummer, Krishna C. Saraswat, Kit M. Cham