| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2013 | J | jnl |
SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2010 | B | conf |
ETS
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2007 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2007 | J | jnl |
Syst. Comput. Jpn.
|
| 2006 | Misc | conf |
VTS
|
| 2006 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2006 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2005 | J | jnl |
J. Comput. Sci. Technol.
|
| 2005 | A | conf |
ITC
|
| 2005 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2005 | Misc | conf |
VTS
|
| 2005 | J | jnl |
J. Electron. Test.
|
| 2004 | — | conf |
DELTA
|
| 2004 | A | conf |
ICCAD
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | Misc | conf |
VLSI Design
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2002 | J | jnl |
Syst. Comput. Jpn.
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | — | conf |
DELTA
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | A | conf |
ITC
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2001 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 2000 | J | jnl |
J. Electron. Test.
|
| 2000 | — | conf |
ASP-DAC
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | A | conf |
ITC
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | J | jnl |
Syst. Comput. Jpn.
|
| 2000 | Misc | conf |
VLSI Design
|
| 2000 | — | conf |
Asian Test Symposium
|
| 1999 | — | conf |
ETW
|
| 1999 | Misc | conf |
VLSI Design
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1999 | — | conf |
Great Lakes Symposium on VLSI
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1999 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | — | conf |
Asian Test Symposium
|
| 1998 | Misc | conf |
VTS
|
| 1997 | Misc | conf |
VLSI Design
|
| 1997 | J | jnl |
Syst. Comput. Jpn.
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1997 | — | conf |
ED&TC
|
| 1997 | J | jnl |
Syst. Comput. Jpn.
|
| 1997 | — | conf |
Asian Test Symposium
|
| 1997 | J | jnl |
Syst. Comput. Jpn.
|
| 1997 | J | jnl |
J. Electron. Test.
|
| 1996 | — | conf |
FTCS
|
| 1996 | — | conf |
Asian Test Symposium
|
| 1995 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 1995 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1995 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 1995 | J | jnl |
Syst. Comput. Jpn.
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1995 | J | jnl |
J. Electron. Test.
|
| 1995 | Misc | conf |
VTS
|
| 1995 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 1995 | — | conf |
FTCS
|
| 1995 | J | jnl |
Syst. Comput. Jpn.
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1995 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1994 | C | conf |
ISCAS
|
| 1994 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1994 | Misc | conf |
VTS
|
| 1994 | A | conf |
ITC
|
| 1993 | A* | conf |
DAC
|
| 1993 | J | jnl |
Syst. Comput. Jpn.
|
| 1993 | J | jnl |
Syst. Comput. Jpn.
|
| 1993 | A | conf |
ICCAD
|
| 1992 | J | jnl |
IEEE Trans. Computers
|
| 1992 | A | conf |
ITC
|
| 1992 | — | conf |
FTCS
|
| 1992 | A | conf |
ITC
|
| 1991 | — | conf |
EURO-DAC
|
| 1991 | J | jnl |
Syst. Comput. Jpn.
|
| 1990 | J | jnl |
IEEE J. Solid State Circuits
|
| 1990 | A | conf |
ITC
|
| 1990 | J | jnl |
J. Electron. Test.
|
| 1990 | — | conf |
FTCS
|
| 1990 | A | conf |
ITC
|
| 1989 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1989 | A | conf |
ITC
|
| 1989 | — | conf |
FTCS
|
| 1989 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1987 | J | jnl |
IEEE Des. Test
|
| 1986 | J | jnl |
IEEE Trans. Computers
|
| 1986 | A | conf |
ITC
|
| 1985 | A | conf |
ITC
|
| 1985 | J | jnl |
Comput. Syst. Sci. Eng.
|
| 1985 | J | jnl |
IEEE Trans. Computers
|
| 1984 | A | conf |
ITC
|
| 1983 | J | jnl |
IEEE Trans. Computers
|
| 1983 | A | conf |
ITC
|
| 1983 | A* | conf |
DAC
|
| 1981 | J | jnl |
IEEE Trans. Computers
|
| 1981 | A* | conf |
DAC
|
| 1979 | J | jnl |
IEEE Trans. Computers
|
| 1979 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1978 | A* | conf |
DAC
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1978 | J | jnl |
IEEE Trans. Computers
|
| 1976 | J | jnl |
IEEE Trans. Computers
|
| 1975 | J | jnl |
IEEE Trans. Computers
|
| 1974 | J | jnl |
IEEE Trans. Computers
|
| 1970 | J | jnl |
IEEE Trans. Computers
|