Konstantin Shibin

12 papers C 1Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2024 — conf
Keynote: Cost-Efficient Reliability for Edge-AI Chips.
LATS
Maksim Jenihhin, Mahdi Taheri, Natalia Cherezova, Mohammad Hasan Ahmadilivani, Hardi Selg, Artur Jutman, Konstantin Shibin, Anton Tsertov, Sergei Devadze, Rama Mounika Kodamanchili, Ahsan Rafiq, Jaan Raik, Masoud Daneshtalab
2024 — conf
Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs.
DFT
Hardi Selg, Konstantin Shibin, Anton Tsertov, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
2023 — conf
On-Chip Sensors Data Collection and Analysis for SoC Health Management.
DFT
Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov
2023 J jnl
On-Chip Sensors Data Collection and Analysis for SoC Health Management.
CoRR
Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov
2017 J jnl
Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure.
IEEE Des. Test
Konstantin Shibin, Sergei Devadze, Artur Jutman, Martin Grabmann, Robin Pricken
2016 C conf
Designing reliable cyber-physical systems overview associated to the special session at FDL'16.
FDL
Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
2016 — conf
On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs.
LATS
Konstantin Shibin, Sergei Devadze, Artur Jutman
2016 J jnl
Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures.
J. Electron. Test.
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
2015 — conf
At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence of Shore Logic.
ATS
Konstantin Shibin, Vivek Chickermane, Brion L. Keller, Christos Papameletis, Erik Jan Marinissen
2015 — conf
Virtual reconfigurable scan-chains on FPGAs for optimized board test.
LATS
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
2014 — conf
Asynchronous Fault Detection in IEEE P1687 Instrument Network.
NATW
Konstantin Shibin, Sergei Devadze, Artur Jutman
2013 J jnl
Effective Scalable IEEE 1687 Instrumentation Network for Fault Management.
IEEE Des. Test
Artur Jutman, Sergei Devadze, Konstantin Shibin