Konstantin O. Petrosyants

20 papers C 2Journal 4Unranked 14
YearRankTypeTitle / Venue / Authors
2025 J jnl
Hardware-Software Complex for SPICE Model Libraries Development.
IEEE Access
Konstantin O. Petrosyants, Aleksandr Yu. Romanov, Mikhail Y. Romashikhin
2021 J jnl
SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C).
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Konstantin O. Petrosyants, Lev M. Sambursky, Maxim V. Kozhukhov, Mamed R. Ismail-Zade, Igor A. Kharitonov, Bo Li
2019 C conf
Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem.
DDECS
Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov
2018 — conf
Compact SPICE Models of the Standard Layout Fragments in LSI Interconnections.
EWDTS
Konstantin O. Petrosyants, N. I. Ryabov, E. I. Batarueva
2018 — conf
SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits.
EWDTS
Konstantin O. Petrosyants, Igor A. Kharitonov
2017 J jnl
Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C).
Microelectron. Reliab.
Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin
2017 — conf
Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications.
EWDTS
Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade
2017 J jnl
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.
J. Electron. Test.
Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov
2016 — conf
Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model.
LATS
Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov
2014 — conf
Analysis and Simulation of temperature-current rise in modern PCB traces.
EWDTS
Konstantin O. Petrosyants, Artur Kortunov, Igor A. Kharitonov, Anton Popov, Natalya Gomanilova, Nikita I. Rjabov
2014 — conf
SPICE model parameters extraction taking into account the ionizing radiation effects.
EWDTS
Konstantin O. Petrosyants, Maxim V. Kozhukhov
2014 — conf
The system of microelectronics education for aerospace industry based on "university-enterprise" link.
EWME
A. N. Tikhonov, Boris G. Lvov, Konstantin O. Petrosyants, Saygid U. Uvaysov, Igor A. Kharitonov, S. V. Balakin, A. N. Chetyrkin, V. N. Krutikov
2013 C conf
Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems.
DSD
Konstantin O. Petrosyants, Igor A. Kharitonov
2013 — conf
Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU.
EWDTS
Konstantin O. Petrosyants, Igor A. Kharitonov, D. A. Popov
2013 — conf
Logi-thermal analysis of digital circuits using mixed-signal simulator Questa ADMS.
EWDTS
Konstantin O. Petrosyants, Nikita I. Rjabov
2013 — conf
New version of automated electro-thermal analysis in Mentor Graphics PCB Design System.
EWDTS
Konstantin O. Petrosyants, P. A. Kozynko, Igor A. Kharitonov, A. V. Sidorov, Y. N. Chichkanov
2013 — conf
Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel.
EWDTS
Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, V. N. Bogatyrev, Z. M. Povarnitcyna, E. S. Drozdenko
2011 — conf
Si BJT and SiGe HBT performance modeling after neutron radiation exposure.
EWDTS
Konstantin O. Petrosyants, Eric Vologdin, Dmitry Smirnov, Rostislav Torgovnikov, Maxim V. Kozhukhov
2011 — conf
TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies.
EWDTS
Konstantin O. Petrosyants, E. V. Orekhov, D. A. Popov, Igor A. Kharitonov, Lev M. Sambursky, A. P. Yatmanov, A. V. Voevodin, A. N. Mansurov
2011 — conf
Thermal analysis of the ball grid array packages.
EWDTS
Konstantin O. Petrosyants, Nikita I. Rjabov