Koji Eriguchi

11 papers Journal 3Unranked 8
YearRankTypeTitle / Venue / Authors
2021 — conf
Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy (TDIS).
IRPS
Tomohiro Kuyama, Keiichiro Urabe, Koji Eriguchi
2015 — conf
A new prediction method for ReRAM data retention statistics based on 3D filament structures.
IRPS
Zhiqiang Wei, Koji Katayama, Shunsaku Muraoka, Ryutaro Yasuhara, Takumi Mikawa, Koji Eriguchi
2015 J jnl
Impacts of plasma process-induced damage on MOSFET parameter variability and reliability.
Microelectron. Reliab.
Koji Eriguchi, Kouichi Ono
2015 — conf
Plasma-induced photon irradiation damage on low-k dielectrics enhanced by Cu-line layout.
ICICDT
Taro Ikeda, Akira Tanihara, Nobuhiko Yamamoto, Shigeru Kasai, Koji Eriguchi, Kouichi Ono
2015 — conf
Surface orientation dependence of ion bombardment damage during plasma processing.
ICICDT
Yukimasa Okada, Koji Eriguchi, Kouichi Ono
2014 — conf
A new aspect of plasma-induced physical damage in three-dimensional scaled structures - Sidewall damage by stochastic straggling and sputtering.
ICICDT
Koji Eriguchi, Yoshinori Takao, Kouichi Ono
2014 — conf
Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs.
ICICDT
Masayuki Kamei, Yoshinori Takao, Koji Eriguchi, Kouichi Ono
2013 — conf
Atomistic simulations of plasma process-induced Si substrate damage - Effects of substrate bias-power frequency.
ICICDT
Asahiko Matsuda, Yoshinori Nakakubo, Yoshinori Takao, Koji Eriguchi, Kouichi Ono
2012 — conf
Optimization problems for plasma-induced damage - A concept for plasma-induced damage design.
ICICDT
Koji Eriguchi, Yoshinori Nakakubo, Asahiko Matsuda, Masayuki Kamei, Yoshinori Takao, Kouichi Ono
2001 J jnl
Effects of base layer thickness on reliability of CVD Si
Microelectron. Reliab.
Koji Eriguchi, Yoshinao Harada, Masaaki Niwa
2001 J jnl
Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics.
Microelectron. Reliab.
Takayuki Yamada, Masaru Moriwaki, Yoshinao Harada, Shinji Fujii, Koji Eriguchi