| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Int. J. Comput. Intell. Syst.
|
| 2025 | J | jnl |
Comput. Ind. Eng.
|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | J | jnl |
Comput. Ind. Eng.
|
| 2023 | Misc | conf |
SAC
|
| 2023 | J | jnl |
Int. J. Prod. Res.
|
| 2023 | J | jnl |
Comput. Ind.
|
| 2022 | J | jnl |
Knowl. Based Syst.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
Int. J. Comput. Intell. Syst.
|
| 2022 | J | jnl |
Comput. Ind.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Comput. Ind. Eng.
|
| 2021 | J | jnl |
Comput. Ind.
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Comput. Ind.
|
| 2021 | J | jnl |
Int. J. Inf. Manag.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
APMS (1)
|
| 2021 | J | jnl |
Eur. J. Oper. Res.
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2020 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | — | conf |
INISCOM
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
EAI Endorsed Trans. Ind. Networks Intell. Syst.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2018 | — | conf |
IEEM
|
| 2018 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|