Kexin Yang

15 papers C 1Misc 1Journal 7Unranked 6
YearRankTypeTitle / Venue / Authors
2022 J jnl
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2021 J jnl
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor
2020 — conf
Inverse Design of FinFET SRAM Cells.
IRPS
Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
2020 J jnl
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation.
IEEE Trans. Very Large Scale Integr. Syst.
Yi-Da Wu, Kexin Yang, Shu-Han Hsu, Linda Milor
2020 J jnl
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations.
IEEE Trans. Very Large Scale Integr. Syst.
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
2019 C conf
Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure.
IOLTS
Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor
2019 — conf
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor.
IWASI
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2019 — conf
Machine Learning for Detection of Competing Wearout Mechanisms.
IRPS
Shu-Han Hsu, Kexin Yang, Linda Milor
2019 — conf
Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators.
DCIS
Shu-Han Hsu, Kexin Yang, Linda Milor
2018 J jnl
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018 Misc conf
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology.
VTS
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
2018 — conf
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms.
DCIS
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
2018 — conf
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology.
DCIS
Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
2017 J jnl
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations.
Microelectron. Reliab.
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
2017 J jnl
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits.
Microelectron. Reliab.
Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor