Kestutis Motiejunas

18 papers C 5Journal 12Unranked 1
YearRankTypeTitle / Venue / Authors
2018 J jnl
Black box delay fault models for non-scan sequential circuits.
Comput. Sci. Inf. Syst.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Liudas Motiejunas, Rimantas Seinauskas
2015 J jnl
Path delay test generation at functional level.
IET Comput. Digit. Tech.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2013 J jnl
Delay fault testing using partial multiple scan chains.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2013 J jnl
Functional delay test generation approach using a software prototype of the circuit.
Comput. Sci. Inf. Syst.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2012 J jnl
Evaluation of testability enhancement using software prototype.
IET Comput. Digit. Tech.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2011 J jnl
A Method for Automated Testing of Software Interface.
Inf. Technol. Control.
Andrej Usaniov, Kestutis Motiejunas
2011 J jnl
Functional fault models for non-scan sequential circuits.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2009 J jnl
Functional delay test generation based on software prototype.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2008 C conf
Development of Functional Delay Tests.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2008 J jnl
Test generation at the algorithm-level for gate-level fault coverage.
Microelectron. Reliab.
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2007 J jnl
Functional Test Generation Based on Combined Random and Deterministic Search Methods.
Informatica
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2007 — conf
Research and development of teaching software engineering processes.
CompSysTech
Eduardas Bareisa, Eimutis Karciauskas, Eugenijus Macikenas, Kestutis Motiejunas
2007 C conf
The Criteria of Functional Delay Test Quality Assessment.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2007 C conf
Transition Faults Testing Based on Functional Delay Tests.
DDECS
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2006 C conf
Transition Fault Test Reuse.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2005 C conf
Functional Test Generation Remote Tool.
DSD
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2005 J jnl
The Realization-Independent Testing Based on the Black Box Fault Models.
Informatica
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas
2003 J jnl
Identifying Legal and Illegal States in Synchronous Sequential Circuits Using Test Generation.
Informatica
Eduardas Bareisa, Kestutis Motiejunas, Rimantas Seinauskas