Kenneth S. M. Fung

12 papers B 1Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2015 J jnl
An INSPECT Measurement System for Moving Objects.
IEEE Trans. Instrum. Meas.
Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam
2015 — conf
An edge-from-focus approach to 3D inspection and metrology.
Image Processing: Machine Vision Applications
Fuqin Deng, Jia Chen, Jianyang Liu, Zhijun Zhang, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam
2013 — conf
A polynomial phase-shift algorithm for high precision three-dimensional profilometry.
Image Processing: Machine Vision Applications
Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam
2013 — conf
An elliptic phase-shift algorithm for high speed three-dimensional profilometry.
Image Processing: Machine Vision Applications
Fuqin Deng, Zhao Li, Jia Chen, Jiangwen Deng, Kenneth S. M. Fung, Edmund Y. Lam
2012 — conf
An illumination-invariant phase-shifting algorithm for three-dimensional profilometry.
Image Processing: Machine Vision Applications
Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S. M. Fung, W. H. Leung, Edmund Y. Lam
2010 J jnl
EC-EGI: enriched complex EGI for 3D shape registration.
Mach. Vis. Appl.
Zhaozheng Hu, Ronald Chung, Kenneth S. M. Fung
2009 J jnl
Reference-Free Machine Vision Inspection of semiconductor die Images.
Int. J. Image Graph.
Ada N. Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S. M. Fung, W. H. Leung
2008 B conf
Handling of multi-reflections in wafer bump 3D reconstruction.
SMC
Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung
2007 J jnl
Optimization of Bit-Pairing Codification with Learning for 3D Reconstruction.
Int. J. Image Graph.
Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung, Yangsheng Xu
2007 — conf
Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights.
IPCV
Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung
2006 — conf
A novel design of grating projecting system for 3D reconstruction of wafer bumps.
Three-Dimensional Image Capture and Applications
Shu Yuan, Ronald Chung, Tan Zheng, Jun Cheng, Edmund Y. Lam, Kenneth S. M. Fung, Fan Wang
2006 — conf
Bit-pairing Codification for Binary Pattern Projection System.
ICPR (2)
Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S. M. Fung