Kenneth P. Parker

42 papers A 30Journal 12

Year	Rank	Type	Title / Venue / Authors
2012	A	`conf`	Capacitive sensing testability in complex memory devices. ITC Kenneth P. Parker
2011	A	`conf`	Surviving state disruptions caused by test: A case study. ITC Kenneth P. Parker, Shuichi Kameyama, David Dubberke
2010	A	`conf`	Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
2010	A	`conf`	Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. ITC C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill
2010	A	`conf`	Surviving state disruptions caused by test: The "Lobotomy Problem". ITC Kenneth P. Parker
2009	A	`conf`	An outlier detection based approach for PCB testing. ITC Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
2009	A	`conf`	Testing bridges to nowhere - combining Boundary Scan and capacitive sensing. ITC Steve Sunter, Kenneth P. Parker
2009	A	`conf`	What is IEEE P1149.8.1 and why? ITC Kenneth P. Parker, Jeff Burgess
2008	A	`conf`	Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. ITC Dayton Norrgard, Kenneth P. Parker
2008	A	`conf`	Boundary-Scan Testing of Power/Ground Pins. ITC Kenneth P. Parker, Neil G. Jacobson
2007	A	`conf`	A bead probe CAD strategy for in-circuit test. ITC Kenneth P. Parker, Don DeMille
2007	A	`conf`	Finding power/ground defects on connectors - a new approach. ITC Kenneth P. Parker, Stephen Hird
2005	A	`conf`	A new probing technique for high-speed/high-density printed circuit boards. ITC Kenneth P. Parker
2005	A	`conf`	Bead probes in practice. ITC Kenneth P. Parker
2005	A	`conf`	The effects of defects on high-speed boards. ITC Kenneth P. Parker
2004	A	`conf`	A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. ITC Kenneth P. Parker
2004	A	`conf`	Board Test Coverage Needs to be Standardized. ITC Kenneth P. Parker
2003	A	`conf`	Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? ITC Kenneth P. Parker
2003	J	`jnl`	IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Des. Test Comput. Bill Eklow, Carl Barnhart, Kenneth P. Parker
2003	J	`jnl`	Testing for what? IEEE Des. Test Comput. Kenneth P. Parker
2002	A	`conf`	Board Test Is NOT Mature. ITC Kenneth P. Parker
2002	A	`conf`	IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC Bill Eklow, Carl Barnhart, Kenneth P. Parker
2002	A	`conf`	Test Coverage: What Does It Mean When a Board Test Passes?. ITC Kathy Hird, Kenneth P. Parker, Bill Follis
2001	A	`conf`	Frequency detection-based boundary-scan testing of AC coupled nets. ITC Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick
2000	A	`conf`	System issues in boundary-scan board test. ITC Kenneth P. Parker
1997	A	`conf`	Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa
1996	A	`conf`	Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. ITC Kenneth P. Parker
1996	A	`conf`	Opens Board Test Coverage: When is 99% Really 40%? ITC Mick Tegethoff, Kenneth P. Parker, Ken Lee
1995	J	`jnl`	IEEE Std 1149.1: Where Are We? Where From Here? IEEE Des. Test Comput. Mick Tegethoff, Kenneth P. Parker
1995	A	`conf`	The ITC Lecture Series: An Experiment. ITC Kenneth P. Parker, David Greene
1994	A	`conf`	Observations on the 1149.x Family of Standards. ITC Kenneth P. Parker
1993	A	`conf`	Structure and Metrology for an Analog Testability Bus. ITC Kenneth P. Parker, John E. McDermid, Stig Oresjo
1991	J	`jnl`	A language for describing boundary scan devices. J. Electron. Test. Kenneth P. Parker, Stig Oresjo
1990	A	`conf`	A language for describing boundary-scan devices. ITC Kenneth P. Parker, Stig Oresjo
1989	J	`jnl`	The impact of boundary scan on board test. IEEE Des. Test Kenneth P. Parker
1986	J	`jnl`	Testability: Barriers to Acceptance. IEEE Des. Test Kenneth P. Parker
1982	J	`jnl`	Design for Testability - A Survey. IEEE Trans. Computers Thomas W. Williams, Kenneth P. Parker
1979	J	`jnl`	Testing Logic Networks and Designing for Testability. Computer Thomas W. Williams, Kenneth P. Parker
1978	J	`jnl`	Boolean Network Probabilities and Network Design. IEEE Trans. Computers Edward J. McCluskey, Kenneth P. Parker, John J. Shedletsky
1978	J	`jnl`	Sequential Circuit Output Probabilities From Regular Expressions. IEEE Trans. Computers Kenneth P. Parker, Edward J. McCluskey
1975	J	`jnl`	Analysis of Logic Circuits with Faults Using Input Signal Probabilities. IEEE Trans. Computers Kenneth P. Parker, Edward J. McCluskey
1975	J	`jnl`	Probabilistic Treatment of General Combinational Networks. IEEE Trans. Computers Kenneth P. Parker, Edward J. McCluskey