Kenneth M. Butler

57 papers A* 4A 33B 1C 1Misc 4Journal 13Unranked 1

Year	Rank	Type	Title / Venue / Authors
2017	A	`conf`	Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. ITC Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen
2016	A	`conf`	Statistical outlier screening as a test solution health monitor. ITC David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar
2016	A	`conf`	What we know after twelve years developing and deploying test data analytics solutions. ITC Kenneth M. Butler, Amit Nahar, W. Robert Daasch
2015	A	`conf`	A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. DATE Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler
2014	A	`conf`	Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. ITC Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler
2013	A	`conf`	A design-for-reliability approach based on grading library cells for aging effects. ITC Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
2013	B	`conf`	Adaptive quality binning for analog circuits. ETS Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013	J	`jnl`	Efficient Process Shift Detection and Test Realignment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013	J	`jnl`	Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. Very Large Scale Integr. Syst. Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013	J	`jnl`	Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
2013	A	`conf`	Test data analytics - Exploring spatial and test-item correlations in production test data. ITC Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler
2012	A*	`conf`	Early prediction of NBTI effects using RTL source code analysis. DAC Jayanand Asok Kumar, Kenneth M. Butler, Heesoo Kim, Shobha Vasudevan
2011	A	`conf`	Adaptive multidimensional outlier analysis for analog and mixed signal circuits. ITC Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2011	A	`conf`	Die-level adaptive test: Real-time test reordering and elimination. ITC Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
2011	A	`conf`	Test cost reduction through performance prediction using virtual probe. ITC Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler
2010	A	`conf`	Adapting to adaptive testing. DATE Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
2010	A	`conf`	Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2010	J	`jnl`	Power Supply Noise: A Survey on Effects and Research. IEEE Des. Test Comput. Mohammad Tehranipoor, Kenneth M. Butler
2009	J	`jnl`	Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
2009	C	`conf`	Quality improvement and cost reduction using statistical outlier methods. ICCD Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger
2008	A	`conf`	Modeling Test Escape Rate as a Function of Multiple Coverages. ITC Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena
2007	J	`jnl`	Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Des. Test Comput. Mohammad Tehranipoor, Kenneth M. Butler
2007	J	`jnl`	Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler
2006	J	`jnl`	Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Des. Test Comput. Kenneth M. Butler
2004	A	`conf`	Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington
2004	A	`conf`	Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC Kenneth M. Butler
2003	A	`conf`	A Case Study of IR-Drop in Structured At-Speed Testing. ITC Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger
2003	J	`jnl`	Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Des. Test Comput. Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang
2002	A	`conf`	Facilitating Rapid First Silicon Debug. ITC Hari Balachandran, Kenneth M. Butler, Neil Simpson
2002	A	`conf`	Is ITC Bored with Board Test? ITC Kenneth M. Butler
2002	A	`conf`	Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech
2001	A	`conf`	A case study on the implementation of the Illinois Scan Architecture. ITC Frank F. Hsu, Kenneth M. Butler, Janak H. Patel
2001	A	`conf`	An analysis of power reduction techniques in scan testing. ITC Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
2001	J	`jnl`	Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
2000	A	`conf`	An empirical study on the effects of test type ordering on overall test efficiency. ITC Jayashree Saxena, Kenneth M. Butler
2000	A	`conf`	Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler
1999	A	`conf`	A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC Kenneth M. Butler
1999	A	`conf`	Correlation of logical failures to a suspect process step. ITC Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith
1999	J	`jnl`	Estimating the Economic Benefits of DFT. IEEE Des. Test Comput. Kenneth M. Butler
1999	A	`conf`	Expediting ramp-to-volume production. ITC Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala
1999	Misc	`conf`	REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
1998	A	`conf`	On applying non-classical defect models to automated diagnosis. ITC Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
1998	A	`conf`	The stuck-at fault: it ain't over 'til it's over. ITC Kenneth M. Butler
1997	Misc	`conf`	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
1997	J	`jnl`	Automated Diagnosis in Testing and Failure Analysis. IEEE Des. Test Comput. Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena
1997	A	`conf`	Bridging Fault Diagnosis in the Absence of Physical Information. ITC David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler
1997	A	`conf`	So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
1996	A	`conf`	Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena
1995	A	`conf`	Deep Submicron: Is Test Up to the Challenge? ITC Kenneth M. Butler
1995	A	`conf`	Test Generation and Design for Test for a Large Multiprocessing DSP. ITC Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell
1994	Misc	`conf`	Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. VTS Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry
1992	Misc	`conf`	The roles of controllability and observability in design for test. VTS Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross
1991	J	`jnl`	Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electron. Test. Don E. Ross, Kenneth M. Butler, M. Ray Mercer
1991	—	`conf`	Fast functional evaluation of candidate OBDD variable orderings. EURO-DAC Don E. Ross, Kenneth M. Butler, Rohit Kapur, M. Ray Mercer
1991	A*	`conf`	Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer
1990	A*	`conf`	The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. DAC Kenneth M. Butler, M. Ray Mercer
1988	A*	`conf`	CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler