Kenneth A. Sudduth

12 papers Journal 12
YearRankTypeTitle / Venue / Authors
2024 J jnl
Assessing the impact of soil and field conditions on cotton crop emergence using UAV-based imagery.
Comput. Electron. Agric.
Fengkai Tian, Curtis J. Ransom, Jianfeng Zhou, Bradley Wilson, Kenneth A. Sudduth
2024 J jnl
Evaluating UAV-Based Remote Sensing for Hay Yield Estimation.
Sensors
Kyuho Lee, Kenneth A. Sudduth, Jianfeng Zhou
2023 J jnl
Developing an image processing pipeline to improve the position accuracy of single UAV images.
Comput. Electron. Agric.
Aijing Feng, Chin Nee Vong, Jing Zhou, Lance S. Conway, Jianfeng Zhou, Earl Vories, Kenneth A. Sudduth, Newell R. Kitchen
2022 J jnl
Corn emergence uniformity estimation and mapping using UAV imagery and deep learning.
Comput. Electron. Agric.
Chin Nee Vong, Lance S. Conway, Aijing Feng, Jianfeng Zhou, Newell R. Kitchen, Kenneth A. Sudduth
2022 J jnl
Extraction of reflectance spectra features for estimation of surface, subsurface, and profile soil properties.
Comput. Electron. Agric.
Peng Zhou, Kenneth A. Sudduth, Kristen S. Veum, Minzan Li
2021 J jnl
Early corn stand count of different cropping systems using UAV-imagery and deep learning.
Comput. Electron. Agric.
Chin Nee Vong, Lance S. Conway, Jianfeng Zhou, Newell R. Kitchen, Kenneth A. Sudduth
2020 J jnl
AI Down on the Farm.
IT Prof.
Kenneth A. Sudduth, M. Jennifer Woodward-Greene, Bryan W. Penning, Martin A. Locke, Adam R. Rivers, Kristen S. Veum
2020 J jnl
Evaluation of Cotton Emergence Using UAV-Based Narrow-Band Spectral Imagery with Customized Image Alignment and Stitching Algorithms.
Remote. Sens.
Aijing Feng, Jianfeng Zhou, Earl Vories, Kenneth A. Sudduth
2020 J jnl
Evaluation of cotton emergence using UAV-based imagery and deep learning.
Comput. Electron. Agric.
Aijing Feng, Jianfeng Zhou, Earl Vories, Kenneth A. Sudduth
2019 J jnl
Development of a multi-band sensor for crop temperature measurement.
Comput. Electron. Agric.
Philip L. Drew, Kenneth A. Sudduth, E. John Sadler, Allen L. Thompson
2019 J jnl
Improving In-Situ Estimation of Soil Profile Properties Using a Multi-Sensor Probe.
Sensors
Xiaoshuai Pei, Kenneth A. Sudduth, Kristen S. Veum, Minzan Li
2018 J jnl
Predicting Profile Soil Properties with Reflectance Spectra via Bayesian Covariate-Assisted External Parameter Orthogonalization.
Sensors
Kristen S. Veum, Paul A. Parker, Kenneth A. Sudduth, Scott H. Holan