Ken Mackay

11 papers A 1B 1Journal 5Unranked 4
YearRankTypeTitle / Venue / Authors
2020 J jnl
Practical Experiments to Evaluate Quality Metrics of MRAM-Based Physical Unclonable Functions.
IEEE Access
Arash Nejat, Frederic Ouattara, Mohammad Mohammadinodoushan, Bertrand Cambou, Ken Mackay, Lionel Torres
2019 J jnl
Practical Experiments on Fabricated TAS-MRAM Dies to Evaluate the Stochastic Behavior of Voltage-Controlled TRNGs.
IEEE Access
Frederic Ouattara, Arash Nejat, Lionel Torres, Ken Mackay
2018 J jnl
An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays.
IEEE Trans. Emerg. Top. Comput.
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay
2015 — conf
Automated characterization of TAS-MRAM test arrays.
DTIS
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay
2015 — conf
Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions.
NVMTS
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay
2014 J jnl
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.
IEEE Trans. Very Large Scale Integr. Syst.
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay
2013 J jnl
Breakdown mechanisms in MgO based magnetic tunnel junctions and correlation with low frequency noise.
Microelectron. Reliab.
S. Amara-Dababi, Ricardo C. Sousa, H. Béa, Claire Baraduc, Ken Mackay, Bernard Dieny
2013 — conf
Scalability and logic functionalities of TA-MRAMs.
NEWCAS
Ioan Lucian Prejbeanu, Ricardo C. Sousa, Bernard Dieny, Jean-Pierre Nozieres, S. Bandiera, Jérémy Alvarez-Herault, Q. Stainer, L. Lombard, Clarisse Ducruet, Y. Conraux, Ken Mackay
2012 B conf
Coupling-based resistive-open defects in TAS-MRAM architectures.
ETS
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay
2012 — conf
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.
Asian Test Symposium
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay
2012 A conf
Impact of resistive-open defects on the heat current of TAS-MRAM architectures.
DATE
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay