Keith A. Jenkins

42 papers A 1B 1C 1Misc 4Journal 23Unranked 12

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	How to Measure the Frequency Response of Nanoscale Transistors. IEEE Instrum. Meas. Mag. Keith A. Jenkins
2025	J	`jnl`	Understanding and Measuring the Jitter Generated by Digital CMOS Gates. Circuits Syst. Signal Process. Keith A. Jenkins
2018	—	`conf`	Effect of HCI degradation on the variability of MOSFETS. IRPS C. Zhou, Keith A. Jenkins, P. I. Chuang, Christos Vezyrtzis
2018	—	`conf`	Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song
2017	—	`conf`	Electron mobility in thin In0.53Ga0.47As channel. ESSDERC Eduard Cartier, Atreya Majumdar, K.-T. Lee, Takashi Ando, Martin M. Frank, John Rozen, Keith A. Jenkins, C. Liang, C.-W. Cheng, John Bruley, M. Hopstaken, Pranita Kerber, J.-B. Yau, X. Sun, Renee T. Mo, Chun-Chen Yeh, Effendi Leobandung, Vijay Narayanan
2016	C	`conf`	A statistical critical path monitor in 14nm CMOS. ICCD Bruce M. Fleischer, Christos Vezyrtzis, Karthik Balakrishnan, Keith A. Jenkins
2015	J	`jnl`	A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. IEEE Trans. Very Large Scale Integr. Syst. Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim
2015	—	`conf`	Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. IRPS Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler
2015	—	`conf`	Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song
2015	J	`jnl`	The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking. IEEE J. Solid State Circuits Eric J. Fluhr, Steve Baumgartner, David W. Boerstler, John F. Bulzacchelli, Timothy Diemoz, Daniel Dreps, George English, Joshua Friedrich, Anne Gattiker, Tilman Gloekler, Christopher J. Gonzalez, Jason Hibbeler, Keith A. Jenkins, Yong Kim, Paul Muench, Ryan Nett, Jose Paredes, Juergen Pille, Donald W. Plass, Phillip J. Restle, Raphael Robertazzi, David Shan, David W. Siljenberg, Michael A. Sperling, Kevin Stawiasz, Gregory S. Still, Zeynep Toprak Deniz, James D. Warnock, Glen A. Wiedemeier, Victor V. Zyuban
2014	—	`conf`	5.3 Wide-frequency-range resonant clock with on-the-fly mode changing for the POWER8 ISSCC Phillip J. Restle, David Shan, David Hogenmiller, Yong Kim, Alan J. Drake, Jason Hibbeler, Thomas J. Bucelot, Gregory S. Still, Keith A. Jenkins, Joshua Friedrich
2014	J	`jnl`	Long-term NBTI degradation under real-use conditions in IBM microprocessors. Microelectron. Reliab. Pong-Fei Lu, Keith A. Jenkins, Tobias Webel, Oliver Marquardt, Birgit Schubert
2013	Misc	`conf`	On-chip circuit for measuring multi-GHz clock signal waveforms. VTS Keith A. Jenkins, Phillip J. Restle, P. Z. Wang, D. Hogenmiller, David W. Boerstler, Thomas J. Bucelot
2013	J	`jnl`	On-chip circuit to monitor long-term NBTI and PBTI degradation. Microelectron. Reliab. Keith A. Jenkins, Pong-Fei Lu
2013	—	`conf`	Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators. ESSCIRC Jente B. Kuang, Keith A. Jenkins, Kevin Stawiasz, Jeremy D. Schaub
2011	—	`conf`	A simple array-based test structure for the AC variability characterization of MOSFETs. ISQED Karthik Balakrishnan, Keith A. Jenkins, Duane S. Boning
2009	J	`jnl`	A Local Random Variability Detector With Complete Digital On-Chip Measurement Circuitry. IEEE J. Solid State Circuits Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim
2009	Misc	`conf`	A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. VTS Keith A. Jenkins, Lionel Li
2008	—	`conf`	A Completely Digital On-Chip Circuit for Local-Random-Variability Measurement. ISSCC Rahul M. Rao, Keith A. Jenkins, Jae-Joon Kim
2008	J	`jnl`	An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. IEEE J. Solid State Circuits Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy
2008	J	`jnl`	Experimental Analysis of Substrate Noise Effect on PLL Performance. IEEE Trans. Circuits Syst. II Express Briefs Woogeun Rhee, Keith A. Jenkins, John C. Liobe, Herschel A. Ainspan
2007	—	`conf`	On-Chip Circuit for Measuring Period Jitter and Skew of Clock Distribution Networks. CICC Keith A. Jenkins, Kenneth L. Shepard, Zheng Xu
2007	—	`conf`	Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure. ISSCC Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy
2005	—	`conf`	An on-chip jitter measurement circuit with sub-picosecond resolution. ESSCIRC Keith A. Jenkins, Anup P. Jose, David F. Heidel
2005	J	`jnl`	Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM J. Res. Dev. John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang
2005	Misc	`conf`	On-Chip Spectrum Analyzer for Analog Built-In Self Test. VTS Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds
2004	A	`conf`	CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho
2004	B	`conf`	Delay chain based programmable jitter generator. ETS Tian Xia, Peilin Song, Keith A. Jenkins, Jien-Chung Lo
2003	J	`jnl`	Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits. IBM J. Res. Dev. Jean-Olivier Plouchart, Noah Zamdmer, Jonghae Kim, Melanie Sherony, Yue Tan, Asit Ray, Mohamed Talbi, Lawrence F. Wagner, Kun Wu, Naftali E. Lustig, Shreesh Narasimha, Patricia O'Neil, Nghia Phan, Michael Rohn, James Strom, David M. Friend, Stephen V. Kosonocky, Daniel R. Knebel, Suhwan Kim, Keith A. Jenkins, Michel M. Rivier
2001	J	`jnl`	A clock distribution network for microprocessors. IEEE J. Solid State Circuits Phillip J. Restle, Timothy G. McNamara, David A. Webber, Peter J. Camporese, Kwok F. Eng, Keith A. Jenkins, David H. Allen, Michael J. Rohn, Michael P. Quaranta, David W. Boerstler, Charles J. Alpert, Craig A. Carter, Roger N. Bailey, John G. Petrovick, Byron L. Krauter, Bradley D. McCredie
2000	J	`jnl`	Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops. IEEE Des. Test Comput. Keith A. Jenkins, James P. Eckhardt
1998	Misc	`conf`	Designing a Testable System on a Chip. VTS Stephen V. Kosonocky, Arthur A. Bright, Kevin W. Warren, Ruud A. Haring, Steve Klepner, Sameh W. Asaad, S. Basavaiah, Bob Havreluk, David F. Heidel, Michael Immediato, Keith A. Jenkins, Rajiv V. Joshi, Benjamin D. Parker, T. V. Rajeevakumar, Kevin Stawiasz
1998	J	`jnl`	Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor. IEEE J. Solid State Circuits Phillip J. Restle, Keith A. Jenkins, Alina Deutsch, Peter W. Cook
1998	J	`jnl`	RF circuit design aspects of spiral inductors on silicon. IEEE J. Solid State Circuits Joachim N. Burghartz, Daniel C. Edelstein, Mehmet Soyuer, Herschel A. Ainspan, Keith A. Jenkins
1997	J	`jnl`	An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator. IEEE J. Solid State Circuits Mehmet Soyuer, Joachim N. Burghartz, Herschel A. Ainspan, Keith A. Jenkins, Peter Xiao, Arvin R. Shahani, Margaret S. Dolan, David L. Harame
1997	J	`jnl`	Detecting and Preventing Measurement Errors. IEEE Des. Test Comput. Keith A. Jenkins
1997	J	`jnl`	Integrated RF components in a SiGe bipolar technology. IEEE J. Solid State Circuits Joachim N. Burghartz, Mehmet Soyuer, Keith A. Jenkins, Michael Kies, Margaret Dolan, Kenneth J. Stein, John Malinowski, David L. Harame
1996	J	`jnl`	A 2.4-GHz silicon bipolar oscillator with integrated resonator. IEEE J. Solid State Circuits Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Herschel A. Ainspan, Frank J. Canora, Slaila Ponnapalli, John F. Ewen, William E. Pence
1996	J	`jnl`	A 3-V 4-GHz nMOS voltage-controlled oscillator with integrated resonator. IEEE J. Solid State Circuits Mehmet Soyuer, Keith A. Jenkins, Joachim N. Burghartz, Michael D. Hulvey
1992	J	`jnl`	Measurement of VLSI power supply current by electron-beam probing. IEEE J. Solid State Circuits Keith A. Jenkins, Robert L. Franch
1991	J	`jnl`	Internal node probing of a DRAM with a low-temperature e-beam tester. IEEE J. Solid State Circuits Keith A. Jenkins, Walter H. Henkels
1991	J	`jnl`	Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM. IEEE J. Solid State Circuits Linda M. Geppert, Urs Bapst, David F. Heidel, Keith A. Jenkins