Keewon Cho

13 papers A 1Journal 6Unranked 6
YearRankTypeTitle / Venue / Authors
2022 — conf
A 1ynm 1.25V 8Gb, 16Gb/s/pin GDDR6-based Accelerator-in-Memory supporting 1TFLOPS MAC Operation and Various Activation Functions for Deep-Learning Applications.
ISSCC
Seong Ju Lee, Kyu-Young Kim, Sanghoon Oh, Joonhong Park, Gimoon Hong, Dong Yoon Ka, Kyu-Dong Hwang, Jeongje Park, Kyeong Pil Kang, Jungyeon Kim, Junyeol Jeon, Nahsung Kim, Yongkee Kwon, Kornijcuk Vladimir, Woojae Shin, Jongsoon Won, Minkyu Lee, Hyunha Joo, Haerang Choi, Jaewook Lee, Donguc Ko, Younggun Jun, Keewon Cho, Ilwoong Kim, Choungki Song, Chunseok Jeong, Dae-Han Kwon, Jieun Jang, Il Park, Junhyun Chun, Joohwan Cho
2020 A conf
Fail Memory Configuration Set for RA Estimation.
ITC
Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong
2019 J jnl
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2018 — conf
2-D Failure Bitmap Compression Using Line Fault Marking Method.
ISOCC
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2018 J jnl
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test.
IEEE J. Emerg. Sel. Topics Circuits Syst.
Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang
2018 J jnl
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation.
IEEE Trans. Reliab.
Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang
2017 — conf
An efficient built-in self-repair scheme for area reduction.
ISOCC
Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang
2017 J jnl
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares.
IEEE Trans. Very Large Scale Integr. Syst.
Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang
2016 J jnl
A Survey of Repair Analysis Algorithms for Memories.
ACM Comput. Surv.
Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang
2016 — conf
Discussion of cost-effective redundancy architectures.
ISOCC
Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang
2015 — conf
Near optimal repair rate built-in redundancy analysis with very small hardware overhead.
ISQED
Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang
2014 J jnl
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories.
IEEE Trans. Very Large Scale Integr. Syst.
Hyungsu Sung, Keewon Cho, Kunsang Yoon, Sungho Kang
2013 — conf
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories.
Asian Test Symposium
Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang