Kedarnath J. Balakrishnan

22 papers A 7B 1Misc 4Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2009 J jnl
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor.
IEEE Des. Test Comput.
Kedarnath J. Balakrishnan, Grady Giles, James Wingfield
2009 A conf
Test access mechanism for multiple identical cores.
ITC
Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield
2008 A conf
Test Access Mechanism for Multiple Identical Cores.
ITC
Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield
2008 J jnl
X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors.
IEEE Trans. Computers
Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei
2007 Misc conf
Efficient Scan-Based BIST Using Multiple LFSRs and Dictionary Coding.
VLSI Design
Kedarnath J. Balakrishnan
2007 Misc conf
RTL Test Point Insertion to Reduce Delay Test Volume.
VTS
Kedarnath J. Balakrishnan, Lei Fang
2007 J jnl
Relationship Between Entropy and Test Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Kedarnath J. Balakrishnan, Nur A. Touba
2007 A conf
Test cost reduction for SoC using a combined approach to test data compression and test scheduling.
DATE
Quming Zhou, Kedarnath J. Balakrishnan
2006 A conf
Efficient unknown blocking using LFSR reseeding.
DATE
Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar
2006 J jnl
Improving Linear Test Data Compression.
IEEE Trans. Very Large Scale Integr. Syst.
Kedarnath J. Balakrishnan, Nur A. Touba
2006 Misc conf
PIDISC: Pattern Independent Design Independent Seed Compression Technique.
VLSI Design
Kedarnath J. Balakrishnan, Seongmoon Wang, Srimat T. Chakradhar
2005 — conf
Compressing Functional Tests for Microprocessors.
Asian Test Symposium
Kedarnath J. Balakrishnan, Nur A. Touba, Srinivas Patil
2005 — conf
Emerging Techniques for Test Data Compression.
Asian Test Symposium
Kedarnath J. Balakrishnan
2005 A conf
Reconfigurable Linear Decompressors Using Symbolic Gaussian Elimination.
DATE
Kedarnath J. Balakrishnan, Nur A. Touba
2005 A conf
XWRC: externally-loaded weighted random pattern testing for input test data compression.
ITC
Seongmoon Wang, Kedarnath J. Balakrishnan, Srimat T. Chakradhar
2004 A conf
Improving Encoding Efficiency for Linear Decompressors Using Scan Inversion.
ITC
Kedarnath J. Balakrishnan, Nur A. Touba
2004 J jnl
Matrix-based software test data decompression for systems-on-a-chip.
J. Syst. Archit.
Kedarnath J. Balakrishnan, Nur A. Touba
2004 — conf
Re-configurable embedded core test protocol.
ASP-DAC
Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan
2004 B conf
Relating entropy theory to test data compression.
ETS
Kedarnath J. Balakrishnan, Nur A. Touba
2003 Misc conf
Deterministic Test Vector Decompression in Software Using Linear Operations.
VTS
Kedarnath J. Balakrishnan, Nur A. Touba
2003 — conf
Scan-Based BIST Diagnosis Using an Embedded Processor.
DFT
Kedarnath J. Balakrishnan, Nur A. Touba
2002 — conf
Matrix-Based Test Vector Decompression Using an Embedded Processor.
DFT
Kedarnath J. Balakrishnan, Nur A. Touba