| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
ACM Trans. Multim. Comput. Commun. Appl.
|
| 2024 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2024 | J | jnl |
IEEE Des. Test
|
| 2024 | — | conf |
MWSCAS
|
| 2023 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2023 | A* | conf |
ICCV
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2021 | — | conf |
CVPR Workshops
|
| 2021 | — | conf |
ISVLSI
|
| 2019 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | Misc | conf |
VTS
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | — | conf |
DFT
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | A | conf |
ITC
|
| 2015 | A | conf |
ITC
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | Misc | conf |
VTS
|
| 2014 | J | jnl |
Proc. IEEE
|
| 2014 | A* | conf |
DAC
|
| 2014 | A | conf |
ITC
|
| 2014 | Misc | conf |
VTS
|
| 2014 | A | conf |
ITC
|
| 2013 | A | conf |
ITC
|
| 2013 | A | conf |
ITC
|
| 2013 | A | conf |
DATE
|
| 2013 | — | conf |
DTIS
|
| 2013 | B | conf |
ETS
|
| 2013 | A | conf |
ITC
|
| 2013 | B | conf |
ETS
|
| 2012 | — | conf |
ICECS
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2012 | — | conf |
DFT
|
| 2012 | A | conf |
ICCAD
|
| 2012 | A | conf |
ITC
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2010 | A | conf |
DATE
|