Kazumasa Yanagisawa

17 papers A* 1Journal 9Unranked 7

Year	Rank	Type	Title / Venue / Authors
2014	J	`jnl`	28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique. IEEE Trans. Very Large Scale Integr. Syst. Yukiko Umemoto, Koji Nii, Jiro Ishikawa, Makoto Yabuuchi, Kazuyoshi Okamoto, Yasumasa Tsukamoto, Shinji Tanaka, Koji Tanaka, Tetsuya Matsumura, Kazutaka Mori, Kazumasa Yanagisawa
2014	—	`conf`	40nm Ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU. ISQED Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa
2012	—	`conf`	An on-chip 250 mA 40 nm CMOS digital LDO using dynamic sampling clock frequency scaling with offset-free TDC-based voltage sensor. SoCC Kazuo Otsuga, Masafumi Onouchi, Yasuto Igarashi, Toyohito Ikeya, Sadayuki Morita, Koichiro Ishibashi, Kazumasa Yanagisawa
2011	—	`conf`	A 1.39-V input fast-transient-response digital LDO composed of low-voltage MOS transistors in 40-nm CMOS process. A-SSCC Masafumi Onouchi, Kazuo Otsuga, Yasuto Igarashi, Toyohito Ikeya, Sadayuki Morita, Koichiro Ishibashi, Kazumasa Yanagisawa
2011	—	`conf`	A 28 nm 50% power reduced 2T mask ROM with 0.72 ns read access time using column source bias. CICC Yukiko Umemoto, Koji Nii, Jiro Ishikawa, Kazuyoshi Okamoto, Kazutaka Mori, Kazumasa Yanagisawa
2011	J	`jnl`	A 28 nm Dual-Port SRAM Macro With Screening Circuitry Against Write-Read Disturb Failure Issues. IEEE J. Solid State Circuits Yuichiro Ishii, Hidehiro Fujiwara, Shinji Tanaka, Yasumasa Tsukamoto, Koji Nii, Yuji Kihara, Kazumasa Yanagisawa
2007	J	`jnl`	Hierarchical Power Distribution With Power Tree in Dozens of Power Domains for 90-nm Low-Power Multi-CPU SoCs. IEEE J. Solid State Circuits Yusuke Kanno, Hiroyuki Mizuno, Yoshihiko Yasu, Kenji Hirose, Yasuhisa Shimazaki, Tadashi Hoshi, Yujiro Miyairi, Toshifumi Ishii, Tetsuya Yamada, Takahiro Irita, Toshihiro Hattori, Kazumasa Yanagisawa, Naohiko Irie
2006	J	`jnl`	90-nm process-variation adaptive embedded SRAM modules with power-line-floating write technique. IEEE J. Solid State Circuits Masanao Yamaoka, Noriaki Maeda, Yoshihiro Shinozaki, Yasuhisa Shimazaki, Koji Nii, Shigeru Shimada, Kazumasa Yanagisawa, Takayuki Kawahara
2006	—	`conf`	Hierarchical Power Distribution with 20 Power Domains in 90-nm Low-Power Multi-CPU Processor. ISSCC Yusuke Kanno, Hiroyuki Mizuno, Yoshihiko Yasu, Kenji Hirose, Yasuhisa Shimazaki, Tadashi Hoshi, Yujiro Miyairi, Toshifumi Ishii, Tetsuya Yamada, Takahiro Irita, Toshihiro Hattori, Kazumasa Yanagisawa, Naohiko Irie
2006	A*	`conf`	Hierarchical power distribution and power management scheme for a single chip mobile processor. DAC Toshihiro Hattori, Takahiro Irita, Masayuki Ito, Eiji Yamamoto, Hisashi Kato, Go Sado, Tetsuhiro Yamada, Kunihiko Nishiyama, Hiroshi Yagi, Takao Koike, Yoshihiko Tsuchihashi, Motoki Higashida, Hiroyuki Asano, Izumi Hayashibara, Ken Tatezawa, Yasuhisa Shimazaki, Naozumi Morino, Yoshihiko Yasu, Tadashi Hoshi, Yujiro Miyairi, Kazumasa Yanagisawa, Kenji Hirose, Saneaki Tamaki, Shinichi Yoshioka, Toshifumi Ishii, Yusuke Kanno, Hiroyuki Mizuno, Tetsuya Yamada, Naohiko Irie, Reiko Tsuchihashi, Nobuto Arai, Tomohiro Akiyama, Koji Ohno
2005	J	`jnl`	A 300-MHz 25-μA/Mb-leakage on-chip SRAM module featuring process-variation immunity and low-leakage-active mode for mobile-phone application processor. IEEE J. Solid State Circuits Masanao Yamaoka, Yoshihiro Shinozaki, Noriaki Maeda, Yasuhisa Shimazaki, Kei Kato, Shigeru Shimada, Kazumasa Yanagisawa, Kenichi Osada
2004	J	`jnl`	Probabilistic crosstalk delay estimation for ASICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Kan Takeuchi, Kazumasa Yanagisawa, Takashi Sato, Kazuko Sakamoto, Saburo Hojo
2002	J	`jnl`	A system LSI memory redundancy technique using an ie-flash (inverse-gate-electrode flash) programming circuit. IEEE J. Solid State Circuits Masanao Yamaoka, Kazumasa Yanagisawa, Shoji Shukuri, Katsuhiro Norisue, Koichiro Ishibashi
2001	—	`conf`	An efficient method of applying hot-carrier reliability simulation to logic design. CICC Hisuko Sato, Mariko Ohtsuka, Kazumasa Yanagisawa, Peter M. Lee
2001	—	`conf`	CMOS process compatible ie-Flash (inverse gate electrode Flash) technology for system-on-a-chip. CICC Shoji Shukuri, Kazumasa Yanagisawa, Koichiro Ishibashi
1997	J	`jnl`	A modular architecture for a 6.4-Gbyte/s, 8-Mb DRAM-integrated media chip. IEEE J. Solid State Circuits Takao Watanabe, Ryo Fujita, Kazumasa Yanagisawa, Hitoshi Tanaka, Kazushige Ayukawa, Mitsuru Soga, Yuji Tanaka, Yoshimitsu Sugie, Yoshinobu Nakagome
1990	J	`jnl`	A 23-ns 1-Mb BiCMOS DRAM. IEEE J. Solid State Circuits Goro Kitsukawa, Kazumasa Yanagisawa, Yutaka Kobayashi, Yoshitaka Kinoshita, Tatsuyuki Ohta, Tetsu Udagawa, Hitoshi Miwa, Hiroyuki Miyazawa, Yoshiki Kawajiri, Yoshiaki Ouchi, Hiromi Tsukada, Tetsuro Matsumoto, Kiyoo Itoh