Katsuyuki Ikeuchi

13 papers A 1Journal 5Unranked 7
YearRankTypeTitle / Venue / Authors
2018 J jnl
An 802.11ax 4 × 4 High-Efficiency WLAN AP Transceiver SoC Supporting 1024-QAM With Frequency-Dependent IQ Calibration and Integrated Interference Analyzer.
IEEE J. Solid State Circuits
Shusuke Kawai, Rui Ito, Kengo Nakata, Yutaka Shimizu, Motoki Nagata, Tomohiko Takeuchi, Hiroyuki Kobayashi, Katsuyuki Ikeuchi, Takayuki Kato, Yosuke Hagiwara, Yuki Fujimura, Kentaro Yoshioka, Shigehito Saigusa, Hiroshi Yoshida, Makoto Arai, Toshiyuki Yamagishi, Hirotsugu Kajihara, Kazuhisa Horiuchi, Hideki Yamada, Tomoya Suzuki, Yuki Ando, Kensuke Nakanishi, Koichiro Ban, Masahiro Sekiya, Yoshimasa Egashira, Tsuguhide Aoki, Kohei Onizuka, Toshiya Mitomo
2018 — conf
An 802.11ax 4×4 spectrum-efficient WLAN AP transceiver SoC supporting 1024QAM with frequency-dependent IQ calibration and integrated interference analyzer.
ISSCC
Shusuke Kawai, Hiromitsu Aoyama, Rui Ito, Yutaka Shimizu, Mitsuyuki Ashida, Asuka Maki, Tomohiko Takeuchi, Hiroyuki Kobayashi, Go Urakawa, Hiroaki Hoshino, Shigehito Saigusa, Kazushi Koyama, Makoto Morita, Ryuichi Nihei, Daisuke Goto, Motoki Nagata, Kengo Nakata, Katsuyuki Ikeuchi, Kentaro Yoshioka, Ryoichi Tachibana, Makoto Arai, Chen Kong Teh, Atsushi Suzuki, Hiroshi Yoshida, Yosuke Hagiwara, Takayuki Kato, Ichiro Seto, Tomoya Horiguchi, Koichiro Ban, Kyosuke Takahashi, Hirotsugu Kajihara, Toshiyuki Yamagishi, Yuki Fujimura, Kazuhisa Horiuchi, Katsuya Nonin, Kengo Kurose, Hideki Yamada, Kentaro Taniguchi, Masahiro Sekiya, Takeshi Tomizawa, Daisuke Taki, Masaaki Ikuta, Tomoya Suzuki, Yuki Ando, Daisuke Yashima, Takahisa Kaihotsu, Hiroki Mori, Kensuke Nakanishi, Takeshi Kumagaya, Yasuo Unekawa, Tsuguhide Aoki, Kohei Onizuka, Toshiya Mitomo
2012 J jnl
Startup Techniques for 95 mV Step-Up Converter by Capacitor Pass-On Scheme and V
IEEE J. Solid State Circuits
Po-Hung Chen, Koichi Ishida, Katsuyuki Ikeuchi, Xin Zhang, Kentaro Honda, Yasuyuki Okuma, Yoshikatsu Ryu, Makoto Takamiya, Takayasu Sakurai
2011 J jnl
1 Gb/s, 50 µm × 50 µm Pads on Board Wireless Connector Based on Track-and-Charge Scheme Allowing Contacted Signaling.
IEICE Trans. Electron.
Katsuyuki Ikeuchi, Hideki Kusamitsu, Mutsuo Daito, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai
2011 — conf
A 95mV-startup step-up converter with Vth-tuned oscillator by fixed-charge programming and capacitor pass-on scheme.
ISSCC
Po-Hung Chen, Koichi Ishida, Katsuyuki Ikeuchi, Xin Zhang, Kentaro Honda, Yasuyuki Okuma, Yoshikatsu Ryu, Makoto Takamiya, Takayasu Sakurai
2011 J jnl
Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing.
IEEE J. Solid State Circuits
Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai
2011 J jnl
Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits.
IEEE Trans. Circuits Syst. II Express Briefs
Yu Pu, Xin Zhang, Katsuyuki Ikeuchi, Atsushi Muramatsu, Atsushi Kawasumi, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai
2011 A conf
Reduction of minimum operating voltage (V
ISLPED
Kentaro Honda, Katsuyuki Ikeuchi, Masahiro Nomura, Makoto Takamiya, Takayasu Sakurai
2011 — conf
Through Silicon Capacitive Coupling (TSCC) interface for 3D stacked dies.
3DIC
Katsuyuki Ikeuchi, Makoto Takamiya, Takayasu Sakurai
2010 — conf
A high-speed, low-power capacitive-coupling transceiver for wireless wafer-level testing systems.
3DIC
Gil-Su Kim, Katsuyuki Ikeuchi, Mutsuo Daito, Makoto Takamiya, Takayasu Sakurai
2010 — conf
Capacitively coupled non-contact probing circuits for membrane-based wafer-level simultaneous testing.
ISSCC
Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai
2009 — conf
Switched Resonant Clocking (SRC) scheme enabling dynamic frequency scaling and low-speed test.
CICC
Katsuyuki Ikeuchi, Kosuke Sakaida, Koichi Ishida, Takayasu Sakurai, Makoto Takamiya
2008 — conf
Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node.
ESSCIRC
Sungdae Choi, Katsuyuki Ikeuchi, Hyunkyung Kim, Kenichi Inagaki, Masami Murakata, Nobuyuki Nishiguchi, Makoto Takamiya, Takayasu Sakurai