Katsuyoshi Miura

12 papers C 1Journal 8Unranked 3
YearRankTypeTitle / Venue / Authors
2018 J jnl
Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope.
Microelectron. Reliab.
Katsuyoshi Miura, Atsuki Seko, Koji Nakamae
2017 C conf
NBTI/PBTI tolerant arbiter PUF circuits.
IOLTS
Koyo Suzuki, Katsuyoshi Miura, Koji Nakamae
2011 J jnl
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.
Microelectron. Reliab.
Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae
2009 J jnl
Laser THz emission microscope as a novel tool for LSI failure analysis.
Microelectron. Reliab.
Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa
2009 J jnl
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.
IEICE Trans. Electron.
Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae
2003 J jnl
A low energy FIB processing, repair, and test system.
Microelectron. Reliab.
Katsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka
2002 J jnl
CAD navigation system, for backside waveform probing of CMOS devices.
Microelectron. Reliab.
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
2001 J jnl
Development of an EB/FIB Integrated Test System.
Microelectron. Reliab.
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
1999 — conf
Intelligent EB Test System for Automatic VLSI Fault Tracing.
Asian Test Symposium
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
1997 — conf
Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.
Asian Test Symposium
Katsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka
1997 J jnl
Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.
J. Electron. Test.
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
1997 — conf
Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system.
ASP-DAC
Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka