Katsuhiko Yamamoto

11 papers A 5C 1Journal 5
YearRankTypeTitle / Venue / Authors
2025 A conf
Non-Intrusive Binaural Speech Intelligibility Prediction Using Mamba for Hearing-Impaired Listeners.
INTERSPEECH
Katsuhiko Yamamoto, Koichi Miyazaki
2025 J jnl
Non-Intrusive Binaural Speech Intelligibility Prediction Using Mamba for Hearing-Impaired Listeners.
CoRR
Katsuhiko Yamamoto, Koichi Miyazaki
2025 C conf
The T12 System for AudioMOS Challenge 2025: Audio Aesthetics Score Prediction System Using KAN- and VERSA-based Models.
ASRU
Katsuhiko Yamamoto, Koichi Miyazaki, Shogo Seki
2025 J jnl
The T12 System for AudioMOS Challenge 2025: Audio Aesthetics Score Prediction System Using KAN- and VERSA-based Models.
CoRR
Katsuhiko Yamamoto, Koichi Miyazaki, Shogo Seki
2020 J jnl
GEDI: Gammachirp envelope distortion index for predicting intelligibility of enhanced speech.
Speech Commun.
Katsuhiko Yamamoto, Toshio Irino, Shoko Araki, Keisuke Kinoshita, Tomohiro Nakatani
2019 J jnl
GEDI: Gammachirp Envelope Distortion Index for Predicting Intelligibility of Enhanced Speech.
CoRR
Katsuhiko Yamamoto, Toshio Irino, Shoko Araki, Keisuke Kinoshita, Tomohiro Nakatani
2019 A conf
Predicting Speech Intelligibility of Enhanced Speech Using Phone Accuracy of DNN-Based ASR System.
INTERSPEECH
Kenichi Arai, Shoko Araki, Atsunori Ogawa, Keisuke Kinoshita, Tomohiro Nakatani, Katsuhiko Yamamoto, Toshio Irino
2018 A conf
Multi-resolution Gammachirp Envelope Distortion Index for Intelligibility Prediction of Noisy Speech.
INTERSPEECH
Katsuhiko Yamamoto, Toshio Irino, Narumi Ohashi, Shoko Araki, Keisuke Kinoshita, Tomohiro Nakatani
2017 A conf
Predicting Speech Intelligibility Using a Gammachirp Envelope Distortion Index Based on the Signal-to-Distortion Ratio.
INTERSPEECH
Katsuhiko Yamamoto, Toshio Irino, Toshie Matsui, Shoko Araki, Keisuke Kinoshita, Tomohiro Nakatani
2016 A conf
Speech Intelligibility Prediction Based on the Envelope Power Spectrum Model with the Dynamic Compressive Gammachirp Auditory Filterbank.
INTERSPEECH
Katsuhiko Yamamoto, Toshio Irino, Toshie Matsui, Shoko Araki, Keisuke Kinoshita, Tomohiro Nakatani
2005 J jnl
Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics.
Microelectron. Reliab.
Wataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame