Karim Arabi

41 papers A 10C 5Misc 10Journal 11Unranked 5
YearRankTypeTitle / Venue / Authors
2023 Misc conf
Exploring the Landscape of Natural Language Processing Research.
RANLP
Tim Schopf, Karim Arabi, Florian Matthes
2023 J jnl
Exploring the Landscape of Natural Language Processing Research.
CoRR
Tim Schopf, Karim Arabi, Florian Matthes
2021 Misc conf
Edge Computing Trends, Design and Test Challenges - Keynote.
VTS
Karim Arabi
2015 — conf
3D VLSI: A Scalable Integration Beyond 2D.
ISPD
Karim Arabi, Kambiz Samadi, Yang Du
2015 A conf
Brain-inspired computing.
ITC
Karim Arabi
2014 A conf
Low power design techniques in mobile processes.
ISLPED
Karim Arabi
2011 Misc conf
Leakage power profiling and leakage power reduction using DFT hardware.
VTS
Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma
2010 J jnl
Guest Editorial.
J. Electron. Test.
Karim Arabi
2010 Misc conf
Power noise and its impact on production test and validation of SoC devices.
VTS
Karim Arabi
2010 Misc conf
Special session 6C: New topic mixed-signal test impact to SoC commercialization.
VTS
Karim Arabi
2008 J jnl
Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOS.
IEEE Trans. Very Large Scale Integr. Syst.
Xiongfei Meng, Resve A. Saleh, Karim Arabi
2007 C conf
A Novel Active Decoupling Capacitor Design in 90nm CMOS.
ISCAS
Xiongfei Meng, Karim Arabi, Resve A. Saleh
2007 J jnl
Power Supply Noise in SoCs: Metrics, Management, and Measurement.
IEEE Des. Test Comput.
Karim Arabi, Resve A. Saleh, Xiongfei Meng
2006 — conf
Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology.
ISQED
Xiongfei Meng, Resve A. Saleh, Karim Arabi
2004 — conf
Mixed RL-Huffman encoding for power reduction and data compression in scan test.
ISCAS (2)
Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha
2003 A conf
Mixed Signal DFT: A Concise Overview.
ICCAD
Bozena Kaminska, Karim Arabi
2003 A conf
Overview of the IEEE P1500 Standard.
ITC
Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
2002 Misc conf
Logic BIST and Scan Test Techniques for Multiple Identical Blocks.
VTS
Karim Arabi
2002 A conf
Mixed-Signal BIST: Fact or Fiction.
ITC
Karim Arabi
2002 Misc conf
Multi-GigaHertz Testing Challenges and Solutions.
VTS
Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei
2001 J jnl
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques.
J. Electron. Test.
Mustapha Slamani, Karim Arabi
1999 J jnl
Oscillation-test methodology for low-cost testing of active analog filters.
IEEE Trans. Instrum. Meas.
Karim Arabi, Bozena Kaminska
1998 J jnl
Design for testability of embedded integrated operational amplifiers.
IEEE J. Solid State Circuits
Karim Arabi, Bozena Kaminska
1998 A conf
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.
ITC
Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska
1998 J jnl
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures.
J. Electron. Test.
Karim Arabi, Bozena Kaminska
1998 J jnl
On chip testing data converters using static parameters.
IEEE Trans. Very Large Scale Integr. Syst.
Karim Arabi, Bozena Kaminska, Mohamad Sawan
1998 C conf
Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation.
ICCD
Hassan Ihs, Karim Arabi, Bozena Kaminska
1997 A conf
Analog and Mixed-Signal Benchmark Circuits-First Release.
ITC
Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti
1997 C conf
Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures.
ICCD
Karim Arabi, Bozena Kaminska
1997 A conf
Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I
ITC
Karim Arabi, Bozena Kaminska
1997 — conf
Efficient and accurate testing of analog-to-digital converters using oscillation-test method.
ED&TC
Karim Arabi, Bozena Kaminska
1997 A conf
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.
ITC
Karim Arabi, Bozena Kaminska
1997 Misc conf
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology.
VTS
Karim Arabi, Bozena Kaminska
1997 J jnl
Testing analog and mixed-signal integrated circuits using oscillation-test method.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Karim Arabi, Bozena Kaminska
1996 Misc conf
A new digital test approach for analog-to-digital converter testing.
VTS
Mehdi Ehsanian, Bozena Kaminska, Karim Arabi
1996 — conf
A wireless implantable electrical stimulator based on two FPGAs.
ICECS
Mohamad Sawan, S. Robin, B. Provost, Y. Eid, Karim Arabi
1996 J jnl
BIST for D/A and A/D Converters.
IEEE Des. Test Comput.
Karim Arabi, Bozena Kaminska, Janusz Rzeszut
1996 C conf
Design for testability of integrated operational amplifiers using oscillation-test strategy.
ICCD
Karim Arabi, Bozena Kaminska, Stephen K. Sunter
1996 Misc conf
Oscillation-test strategy for analog and mixed-signal integrated circuits.
VTS
Karim Arabi, Bozena Kaminska
1995 C conf
An Offset Compensated CMOS Current-Feedback Operational-Amplifier.
ISCAS
Jieyan Zhu, Mohamad Sawan, Karim Arabi
1994 A conf
A new built-in self-test approach for digital-to-analog and analog-to-digital converters.
ICCAD
Karim Arabi, Bozena Kaminska, Janusz Rzeszut