| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Appl. Soft Comput.
|
| 2021 | C | conf |
IECON
|
| 2021 | — | conf |
OCIT
|
| 2020 | — | conf |
ISIE
|
| 2020 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2018 | J | jnl |
Trans. Inst. Meas. Control
|
| 2018 | J | jnl |
J. Circuits Syst. Comput.
|
| 2018 | J | jnl |
J. Circuits Syst. Comput.
|
| 2018 | — | conf |
AMC
|
| 2016 | — | conf |
SysCon
|
| 2016 | — | conf |
SysCon
|
| 2009 | — | conf |
UKSim
|
| 2009 | — | conf |
UKSim
|
| 2008 | — | conf |
ICETET
|
| 2007 | — | conf |
ICIT
|