Kan Takeuchi

19 papers A* 1A 1Journal 9Unranked 8
YearRankTypeTitle / Venue / Authors
2019 — conf
Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance.
IRPS
Kan Takeuchi, Masaki Shimada, Shinya Konishi, Daisuke Oshida, Naoya Ota, Takashi Yasumasu, Koji Shibutani, Tomohiro Iwashita, Tetsuya Kokubun, Fumio Tsuchiya
2018 J jnl
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators.
IET Circuits Devices Syst.
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya
2017 — conf
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator.
A-SSCC
Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani
2016 — conf
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.
ESSCIRC
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya
2015 — conf
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology.
ESSCIRC
Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii
2014 — conf
Assessment of reliability impact on GHz processors with moderate overdrive.
ISQED
Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi
2013 J jnl
Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise.
IEEE Trans. Very Large Scale Integr. Syst.
Kan Takeuchi, Masaki Shimada, Takao Sato, Yusaku Katsuki, Hiroumi Yoshikawa, Hiroaki Matsushita
2012 — conf
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization.
CICC
Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita
2011 J jnl
Non-parametric test of time consistency: Present bias and future bias.
Games Econ. Behav.
Kan Takeuchi
2010 J jnl
Multi-object auctions with package bidding: An experimental comparison of Vickrey and iBEA.
Games Econ. Behav.
Yan Chen, Kan Takeuchi
2008 — conf
A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process.
CICC
Genichi Tanaka, Kan Takeuchi, Minoru Ito, Hiroaki Matsushita
2008 J jnl
Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations.
IEEE Trans. Very Large Scale Integr. Syst.
Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato
2008 A conf
Observations of Supply-Voltage-Noise Dispersion in Sub-nsec.
ITC
Kan Takeuchi, Genichi Tanaka, Hiroaki Matsushita, Kenichi Yoshizumi, Yusaku Katsuki, Takao Sato
2007 A* conf
Shake it up baby: scheduling with package auctions.
EC
Kan Takeuchi, John Lin, Yan Chen, Thomas A. Finholt
2004 — conf
Novel Tactile Sensors Manufactured by Carbon Microcoils.
ICMENS
Xiuqin Chen, Shaoming Yang, M. Hasegawa, Kan Takeuchi, K. Kawabe, Seiji Motojima
2004 J jnl
Probabilistic crosstalk delay estimation for ASICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Kan Takeuchi, Kazumasa Yanagisawa, Takashi Sato, Kazuko Sakamoto, Saburo Hojo
1993 J jnl
Sub-1-V swing internal bus architecture for future low-power ULSIs.
IEEE J. Solid State Circuits
Yoshinobu Nakagome, Kiyoo Itoh, Masanori Isoda, Kan Takeuchi, Masakazu Aoki
1991 J jnl
An experimental 1.5-V 64-Mb DRAM.
IEEE J. Solid State Circuits
Yoshinobu Nakagome, Hitoshi Tanaka, Kan Takeuchi, Eiji Kume, Yasushi Watanabe, Toru Kaga, Yoshifumi Kawamoto, Fumio Murai, Ryuichi Izawa, Digh Hisamoto, Teruaki Kisu, Takashi Nishida, Eiji Takeda, Kiyoo Itoh
1991 J jnl
Circuit techniques for 1.5-3.6-V battery-operated 64-Mb DRAM.
IEEE J. Solid State Circuits
Yoshinobu Nakagome, Kiyoo Itoh, Kan Takeuchi, Eiji Kume, Hitoshi Tanaka, Masanori Isoda, Tatsunori Musha, Toru Kaga, Teruaki Kisu, Takashi Nishida, Yoshifumi Kawamoto, Masakazu Aoki