| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
J. Intell. Manuf.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | A | conf |
ICCAD
|
| 2025 | A | conf |
ICCAD
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | C | conf |
CoDIT
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
ICSRS
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
Appl. Soft Comput.
|
| 2023 | J | jnl |
Artif. Intell. Rev.
|
| 2023 | J | jnl |
J. Intell. Manuf.
|
| 2023 | J | jnl |
Comput. Ind.
|
| 2023 | J | jnl |
Comput. Ind.
|
| 2023 | J | jnl |
J. Intell. Manuf.
|
| 2023 | C | conf |
CoDIT
|
| 2023 | J | jnl |
Adv. Eng. Informatics
|
| 2022 | C | conf |
CoDIT
|
| 2022 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | C | conf |
CoDIT
|
| 2021 | J | jnl |
IEEE Syst. J.
|
| 2021 | J | jnl |
J. Intell. Manuf.
|
| 2021 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2020 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2020 | J | jnl |
J. Intell. Manuf.
|
| 2020 | J | jnl |
J. Signal Process. Syst.
|
| 2019 | J | jnl |
J. Intell. Manuf.
|
| 2019 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2019 | C | conf |
CoDIT
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2019 | J | jnl |
Expert Syst. Appl.
|
| 2019 | J | jnl |
J. Intell. Manuf.
|
| 2019 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
Comput. Ind.
|
| 2019 | C | conf |
CoDIT
|
| 2017 | J | jnl |
CoRR
|
| 2017 | C | conf |
CoDIT
|
| 2017 | J | jnl |
CoRR
|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
J. Intell. Manuf.
|
| 2016 | — | conf |
DepCoS-RELCOMEX
|
| 2016 | J | jnl |
CoRR
|
| 2016 | J | jnl |
Comput. J.
|
| 2016 | — | conf |
CIST
|
| 2015 | — | conf |
ICM
|
| 2015 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2015 | J | jnl |
Comput. Ind.
|
| 2015 | J | jnl |
J. Intell. Manuf.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | — | conf |
ECC
|
| 2013 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2013 | J | jnl |
Remaining useful life estimation based on nonlinear feature reduction and support vector regression.
Eng. Appl. Artif. Intell.
|
| 2012 | J | jnl |
IEEE Trans. Reliab.
|
| 2012 | J | jnl |
IEEE Trans. Reliab.
|
| 2010 | — | conf |
CASE
|
| 2009 | J | jnl |
Simul. Model. Pract. Theory
|
| 2007 | J | jnl |
Int. J. Model. Identif. Control.
|
| 2006 | J | jnl |
Simul. Model. Pract. Theory
|
| 2006 | — | conf |
CDC
|
| 2004 | J | jnl |
Simul.
|