Jérémy Postel-Pellerin

21 papers C 4Journal 9Unranked 8
YearRankTypeTitle / Venue / Authors
2025 — conf
Polysilicon PIN diode characterization and scaling in low-cost 40nm technology for IoT applications.
ICECS
Wiame El Khayyari, Noemie Couzi, Jérémy Postel-Pellerin, Hassen Aziza, Abderrezak Marzaki, François Courbin, Alexandre Malherbe, Arnaud Régnier, Stephan Niel
2024 — conf
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing.
LATS
Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe
2024 — conf
Optimization of digital transistors for low-cost and low-power IoT applications in 40nm technology.
DTTIS
Noemie Couzi, Jérémy Postel-Pellerin, Hassen Aziza, Alexandre Malherbe, Abderrezak Marzaki, Stephan Niel
2022 C conf
STATE: A Test Structure for Rapid Prediction of Resistive RAM Electrical Parameter Variability.
ISCAS
Hassen Aziza, Jérémy Postel-Pellerin, Hussein Bazzi, Mathieu Moreau, Adnan Harb
2021 — conf
Simulation of state of the art EEPROM programming window closure during endurance degradation.
DTIS
Franck Matteo, Roberto Simola, Franck Melul, Karine Coulié, Jérémy Postel-Pellerin, Arnaud Régnier
2020 — conf
Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number Generation.
DFT
Hussein Bazzi, Jérémy Postel-Pellerin, Hassen Aziza, Mathieu Moreau, Adnan Harb
2019 — conf
An Augmented OxRAM Synapse for Spiking Neural Network (SNN) Circuits.
DTIS
Hassen Aziza, Hussein Bazzi, Jérémy Postel-Pellerin, Pierre Canet, Mathieu Moreau, Adnan Harb
2019 C conf
Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.
IOLTS
Mounia Kharbouche-Harrari, Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, Jérémy Postel-Pellerin, Driss Aboulkassimi, Jean-Michel Portal
2019 C conf
Light-Weight Cipher Based on Hybrid CMOS/STT-MRAM: Power/Area Analysis.
ISCAS
Mounia Kharbouche-Harrari, Gregory di Pendina, Romain Wacquez, Bernard Dieny, Driss Aboulkassimi, Jérémy Postel-Pellerin, Jean-Michel Portal
2019 — conf
True random number generation exploiting SET voltage variability in resistive RAM memory arrays.
NVMTS
Jérémy Postel-Pellerin, Hussein Bazzi, Hassen Aziza, Pierre Canet, Mathieu Moreau, Vincenzo Della Marca, Adnan Harb
2018 C conf
Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues.
IOLTS
Mounia Kharbouche-Harrari, Jérémy Postel-Pellerin, Gregory di Pendina, Romain Wacquez, Driss Aboulkassimi, Marc Bocquet, R. Sousa, R. Delattre, Jean-Michel Portal
2018 — conf
MRAM: from STT to SOT, for security and memory.
DCIS
Mounia Kharbouche-Harrari, Rana Alhalabi, Jérémy Postel-Pellerin, Romain Wacquez, Driss Aboulkassimi, Etienne Nowak, Ioan Lucian Prejbeanu, Guillaume Prenat, Gregory di Pendina
2018 J jnl
Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction.
Microelectron. Reliab.
Vincenzo Della Marca, Jérémy Postel-Pellerin, Thibault Kempf, Arnaud Régnier, Philippe Chiquet, Marc Bocquet
2016 J jnl
Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories.
Microelectron. Reliab.
Pierre Canet, Jérémy Postel-Pellerin, Hassen Aziza
2014 J jnl
Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories.
Microelectron. Reliab.
Vincenzo Della Marca, Jérémy Postel-Pellerin, Guillaume Just, Pierre Canet, Jean-Luc Ogier
2013 J jnl
Access resistor modelling for EEPROM's retention test vehicle.
Microelectron. Reliab.
Pierre Canet, Jérémy Postel-Pellerin, Jean-Luc Ogier
2012 J jnl
Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability.
J. Low Power Electron.
Guillaume Just, Vincenzo Della Marca, Arnaud Régnier, Jean-Luc Ogier, Jérémy Postel-Pellerin, Jean-Michel Portal, Pascal Masson
2012 J jnl
Investigation of the effects of constant voltage stress on thin SiO
Microelectron. Reliab.
Philippe Chiquet, Pascal Masson, Romain Laffont, Gilles Micolau, Jérémy Postel-Pellerin, Frédéric Lalande, Bernard Bouteille, Jean-Luc Ogier
2010 J jnl
Leakage paths identification in NVM using biased data retention.
Microelectron. Reliab.
Jérémy Postel-Pellerin, Romain Laffont, Gilles Micolau, Frédéric Lalande, Arnaud Régnier, Bernard Bouteille
2009 J jnl
Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories.
Microelectron. Reliab.
Jérémy Postel-Pellerin, Frédéric Lalande, Pierre Canet, Rachid Bouchakour, F. Jeuland, B. Bertello, B. Villard
2009 J jnl
Modeling charge variation during data retention of MLC Flash memories.
Microelectron. Reliab.
Jérémy Postel-Pellerin, Frédéric Lalande, Pierre Canet, Rachid Bouchakour, F. Jeuland, L. Morancho