| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | J | jnl |
RAIRO Oper. Res.
|
| 2020 | J | jnl |
Comput. Ind. Eng.
|
| 2018 | J | jnl |
J. Intell. Manuf.
|
| 2017 | J | jnl |
Comput. Ind. Eng.
|
| 2017 | J | jnl |
Int. J. Prod. Res.
|
| 2016 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
Expert Syst. Appl.
|
| 2015 | J | jnl |
IEEE Trans. Reliab.
|
| 2012 | J | jnl |
Eur. J. Oper. Res.
|
| 2012 | J | jnl |
Eur. J. Oper. Res.
|
| 2011 | J | jnl |
J. Oper. Res. Soc.
|
| 2007 | J | jnl |
IEEE Trans. Reliab.
|
| 2006 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2006 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2006 | J | jnl |
IEEE Trans. Reliab.
|
| 2006 | J | jnl |
Technometrics
|
| 2004 | J | jnl |
Comput. Stat. Data Anal.
|
| 2002 | J | jnl |
IEEE Trans. Neural Networks
|
| 2002 | J | jnl |
IEEE Trans. Reliab.
|
| 2002 | J | jnl |
Scientometrics
|
| 1999 | J | jnl |
Technometrics
|
| 1993 | J | jnl |
IEEE J. Solid State Circuits
|