Justyna Zawada

14 papers A* 1A 6C 1Journal 5Unranked 1
YearRankTypeTitle / Venue / Authors
2022 J jnl
Efficient Test Compression Configuration Selection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski
2020 A conf
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.
ITC
Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada
2020 A conf
Test Challenges of Intel IA Cores.
ITC
Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin
2019 J jnl
Logic BIST With Capture-Per-Clock Hybrid Test Points.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
2018 J jnl
Hardware Protection via Logic Locking Test Points.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2018 A conf
On New Class of Test Points and Their Applications.
ITC
Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2017 J jnl
Embedded Deterministic Test Points.
IEEE Trans. Very Large Scale Integr. Syst.
Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada
2017 A conf
Full-scan LBIST with capture-per-cycle hybrid test points.
ITC
Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
2016 J jnl
On New Test Points for Compact Cell-Aware Tests.
IEEE Des. Test
Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2016 — conf
On Test Points Enhancing Hardware Security.
ATS
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2016 A conf
Test point insertion in hybrid test compression/LBIST architectures.
ITC
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2015 A* conf
Design for low test pattern counts.
DAC
Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada
2015 A conf
Embedded deterministic test points for compact cell-aware tests.
ITC
Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2014 C conf
Quality assurance in memory built-in self-test tools.
DDECS
Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada